HALT test chamber ΕΤΗ2 series

climatichumiditytemperature

The HALT (Highly Accelerated Life Test) test chamber is an extreme environmental stress testing equipment used to quickly expose design flaws during the product development stage and enhance product reliability. It subjects the product to stresses far beyond the product's specification limits, such as temperature, vibration, and temperature rate changes, to accelerate product failure and assist engineers in optimizing the design. Technical Specifications Capacity215 to 1100LCustomizable Temperature Range100 to +200℃ Consistency:  ≤20%(Higher than the industry standard) Heating &Cooling Rate (average)100℃/min Vibration Frequency Range5 to 10,000Hz Vibration range5 to 100GRMS Vibration Overshoot≤2GRMs Patent Number:  CN201520670413.0 The typical application of the HALT test Electronic industry: Extreme testing of PCBA, chips, and power modules Automotive electronics: High-acceleration aging of ECU, sensors, and battery systems Military/Space: Failure analysis of satellite components and avionics equipment Medical equipment: Extreme environment verification of implantable devices Standard IPC-9592 (Electronic Component HALT/HASS Standard) Defines a temperature change rate of ≥ 30°C/min and a vibration magnitude of ≥ 30 Grms. JEDEC JESD94 (Semiconductor Device Application Guide) Recommended temperature range: -55℃ to +150℃, temperature change rate ≥ 40℃/min. GJB 899A-2009 (China Military Reliability Test Standard) · Reliability Testing: highly accelerated stress screening test for electronics, automotive components, aerospace systems, and medical devices. · Failure Analysis: Identifies design weaknesses and manufacturing defects. · Production Screening: Ensures product robustness via HASS (Highly Accelerated Stress Screening) in mass production. · R&D Validation: Validates product lifespan under extreme conditions (temperature, vibration, humidity).