Optical imaging system EEM® View

for analysis

EEM View is a completely new concept system in the world which delivers fluorescence, reflection spectra and these images simultaneously. To make it possible, AI technology is applied to analyze data with a special algorithm*1. This measurement is possible by installing the EEM View Accessory on the F-7000 / 7100 Fluorescent Spectrophotometer. New technology capable of capturing fluorescence and reflection images and spectra of a sample simultaneously. • Measurement of spectrum data for samples (spectral and fluorescence properties). • Captures images under white light or monochromatic light (area: Φ20 mm, wavelength range: 380 to 700 nm) • Displays separated fluorescence and reflection images obtained using an analysis algorithm that applies AI technology＊1 • Displays spectra for each partition in an image＊1 (fluorescence spectrum and reflection spectrum) Fluorescence Spectrophotometer equipped with CMOS camera imaging system - Uniform illumination system using an integrating sphere Captures fluorescence and reflection images and spectra of samples simultaneously! Diffusion of illumination using integrating sphere Highly uniform illumination of samples Dual detection using fluorescence spectroscope and CMOS camera A spectrofluorometric microscope is an option that can be attached to the sample chamber of the existing Model F-7100 fluorescence spectrophotometer equipped with CMOS camera.