Hitachi High-Tech Europe GmbH: Metrology - Laboratory - DirectIndustry

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Hitachi High-Tech Europe GmbH

All Hitachi High-Tech Europe GmbH products

Focused Ion Beam Systems

focused ion beam system

focused ion beam system NX5000

focused ion beam system

focused ion beam system NX9000

focused ion beam system

focused ion beam system NX2000

High-Resolution Field Emission SEM

scanning electron microscope

scanning electron microscope SU9600 (T)SEM

for thin-film measurements for research for materials research

field emission scanning electron microscope

field emission scanning electron microscope SU8700

for analysis floor-standing Schottky field emission

field emission scanning electron microscope

field emission scanning electron microscope SU8600

for analysis 3D cold field emission

field emission scanning electron microscope

field emission scanning electron microscope SU7000

for analysis in-situ BF-STEM

Sample and Cross-Section Preparation

automatic sample preparation system

automatic sample preparation system ZoneSEM Ⅱ

for electron microscopy for SEM cleaning

automatic sample preparation system

automatic sample preparation system IM4000 II

polymer for the laboratory for electron microscopy

automatic sample preparation system

automatic sample preparation system IM5000

for SEM ion beam milling cooling

automatic sample preparation system

automatic sample preparation system ZoneTEM II

for the laboratory for electron microscopy for SEM

Software

image-processing software

image-processing software EM

automation for scanning electron microscopes for microscopy

SU3800 / SU3900 VP (FE) SEM Family

scanning electron microscope

scanning electron microscope SU3 series

multipurpose for analysis for quality control

FE-SEM microscope

FE-SEM microscope SU3800SE

multipurpose steel inspection for materials inspection

Table Top / Compact SEM

scanning electron microscope

scanning electron microscope TM4000PlusIII

measuring for analysis topography

scanning electron microscope

scanning electron microscope FlexSEM II

multipurpose for analysis for non-metallic inclusion inspection

Transmission Electron Microscopes

STEM microscope

STEM microscope HF5000

for materials research for materials analysis metrology

transmission electron microscope

transmission electron microscope HT78 series

biomedical for research bright field

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