Hitachi High-Tech Europe GmbH: Metrology - Laboratory - DirectIndustry

Exhibit with us

{{>currencyLabel}}
- Back

English
- Back
- Français
- Español
- Italiano
- Deutsch
- 中文
- 日本語
- português
- Русский

Your most recent searches Delete

Frequent searches

Suggestions

Other sections

Search {0} in Catalogues Search {0} in Projects Search {0} in News & Trends

Brands containing {0}

Products >
Hitachi High-Tech Europe GmbH

All Hitachi High-Tech Europe GmbH products

Electron Microscopes (SEM/TEM/STEM)

scanning transmission electron microscope

scanning transmission electron microscope SU9000 II

for analysis for research BF-STEM

field emission scanning electron microscope

field emission scanning electron microscope SU8700

for analysis floor-standing Schottky field emission

field emission scanning electron microscope

field emission scanning electron microscope SU8600

for analysis 3D cold field emission

field emission scanning electron microscope

field emission scanning electron microscope SU7000

for analysis BF-STEM DF-STEM

scanning electron microscope

scanning electron microscope SU3800/3900 Family

surface roughness for analysis for research

scanning electron microscope

scanning electron microscope FlexSEM II

multipurpose for analysis for non-metallic inclusion inspection

SEM microscope TM4000PlusIII

measuring for analysis topography

STEM microscope

STEM microscope HF5000

for materials research for materials analysis metrology

transmission electron microscope

transmission electron microscope HT7800 Series

for research biomedical bright field

FE-SEM microscope

FE-SEM microscope SU3800SE/SU3900SE

multipurpose steel inspection for materials inspection

Focused Ion Beam Systems (FIB/FIB-SEM)

focused ion beam system

focused ion beam system NX5000

focused ion beam system

focused ion beam system NX9000

focused ion beam system

focused ion beam system NX2000

Sample and Cross-Section Preparation

automatic sample preparation system

automatic sample preparation system ZoneSEM Ⅱ

for the laboratory for SEM cleaning

automatic sample preparation system

automatic sample preparation system IM4000 II

for SEM ion beam milling cooling

automatic sample preparation system

automatic sample preparation system ArBlade 5000 / IM5000-CTC

for SEM ion beam milling cooling

automatic sample preparation system

automatic sample preparation system ZoneTEM II

for SEM cleaning benchtop

Remove all

Compare up to 10 products