FE-SEM microscope SU3800SE

multipurposesteel inspectionfor materials inspection

Powerful, versatile SEMs designed for performance, large-sample handling, and user-friendly automation imaging needs in academia and industry.

Why choose the SU3800SE and SU3900SE?

The Hitachi SU3800SE and SU3900SE scanning electron microscopes give you an imaging and analytical solution for a wide range of applications. These instruments deliver high-resolution imaging, easy sample navigation, and advanced automation features - offering reliable, consistent results across different use cases. Whether you need to handle standard samples or larger industrial materials, these SEMs give you the versatility and stability to support your lab’s goals. Ideal for both research labs and industrial environments, the SU3800SE and SU3900SE help reduce time to data, enhance productivity, and ensure reproducible results.

Features and benefits

Can handle a wide range of sample

Both the SU3800SE and SU3900SE feature heavy-duty, accurate eucentric 5-axes specimen stages.

SU3900SE: Capable of accommodating specimens up to 300mm in diameter, 130mm in height, and 5kg in weight. You can navigate on all 5 stage axes. Ideal for imaging large, heavy industrial materials such as automotive components without needing to cut them down to smaller sizes, saving you time. Or you can accommodate multiple samples, e.g. up to 11 filters of 47mm diameter for long-term automated inspections.

SU3800SE: Designed for smaller specimens up to 200mm in diameter, 80mm in height, and 2kg in weight. Provides the flexibility needed for general sample analysis across a wide range of fields.

Whether you’re working with standard lab samples or large industrial materials, these SEMs can meet your needs.

Effortless navigation and précision control

Equipped with a motorized, eucentric 5-axis stage (X, Y, Z, tilt, and rotation), providing full control over specimen positioning.

Automatically activated stage collision model ensures worry-free navigation.

Advanced optical camera system covers the entire range of motion, enabling precise and easy navigation across large samples.

Enhance your observation capabilities with seamless specimen navigation, ensuring accurate and consistent imaging every time.

High-resolution and auto-aligned imaging for consistent, high-quality results

The Schottky field emission powered optics don’t interact with the specimen, magnetically or electrically. So these microscopes offer consistently high imaging performance across a wide range of specimens.

A variable pressure mode is provided as standard. This enables easy observation and high–current analysis of non-conductive samples without needing further sample preparation.

Auto-alignment functions for the optics are fast and accurate. So inexperienced operators can obtain high-quality results quickly.