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- Hitachi
Hitachi analysis microscopes
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Magnification: 3,000,000 unit
Resolution: 0.8, 0.4, 1.2 nm
... to 0.7 sr can be mounted close to the sample for high-resolution elemental analysis in both SEM and STEM mode. Product features: - SEM-STEM combination with ExB-filtered SEM signal and scattering ...
Hitachi High-Tech Europe GmbH
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.9, 0.6 nm
... performance - without the need for a decelerating field on the sample - from 100V (10V option) up to 30kV acceleration voltage. EDX analysis and high-resolution imaging with all detectors are possible at 6mm working distance - Reliable ...
Hitachi High-Tech Europe GmbH
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.7, 0.6 nm
... for optimum light element analysis. These can be used with the SU8600 in the entire beam energy range up to 30keV, and at the shortest working distances from 4 mm due to the magnetic immersion lens. Or you could combine the SEM ...
Hitachi High-Tech Europe GmbH
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.9, 0.8 nm
The SU7000 is ideal for large or heavy samples and for integrating a wide range of accessories. These accessories include analytical detectors or stage attachments for in-situ sample manipulation (stretching [tensile] / compression, heating/cooling, probing, ...
Hitachi High-Tech Europe GmbH
Magnification: 5 unit - 800,000 unit
Resolution: 15, 4, 3 nm
... overview: Colour navigation images of the sample plates cover the entire sample area observable by SEM - Carefree operation - collisions between the stage and SEM components are virtually eliminated by automatically ...
Hitachi High-Tech Europe GmbH
Magnification: 6 unit - 800,000 unit
Resolution: 4, 15 nm
... FlexSEM II is a table-top / compact SEM for imaging tasks that go beyond the performance of conventional table-top SEMs. It’s the ideal system for anyone who doesn’t want to invest in a classic SEM, but also doesn’t want to compromise ...
Hitachi High-Tech Europe GmbH
Magnification: 10 unit - 250,000 unit
... overview. This can be supplemented locally by SEM photo snapshots. Product features: - EDX with 30mm2 or 60mm2 sensor size can be fully integrated, immediate switching between observation and element analysis - 4 ...
Hitachi High-Tech Europe GmbH
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