SEM microscope TM4000 series
for analysismeasuringatomic number contrast

SEM microscope
SEM microscope
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Characteristics

Type
SEM
Technical applications
for analysis, measuring
Observation technique
atomic number contrast, topography
Configuration
benchtop, compact
Detector type
back-scattered electron, secondary electron
Other characteristics
simple installation, digital camera, high-resolution, automated, image-processing, cost-effective, motorized, earth sciences, for nanotechnology, for air/liquid use, topography, with profiler function, variable pressure scanning, for integration microscope and profilometer, asbestos identification, for flat samples, high-contrast, for polished samples, high-magnification
Magnification

Min.: 10 unit

Max.: 25,000,054 unit

Weight

54 kg
(119 lb)

Length

614 mm, 617 mm
(24.2 in, 24.3 in)

Width

330 mm
(13 in)

Height

547 mm
(21.5 in)

Description

The TM4000 Series features innovation and cutting-edge technologies which redefine the capabilities of a tabletop microscope. This new generation of the long-standing Hitachi tabletop microscopes (TM) integrates ease of use, optimized imaging, and high-image quality, while maintaining the compact design of the well-established Hitachi TM Series products. Experience the new dimension of tabletop microscopes with the Hitachi TM4000 II and TM4000Plus II. A quality image can be obtained with simple steps. Automation, Observation, and Elemental Analysis Easy to switch images with one-click. Rapid acquisition of elemental maps * Sample : Movement of watch Intuitive operation on Camera Navi * Use of optical images helps navigate to target observation area easily. Obtained SEM images can be layered on a SEM MAP image. Report Creator Simply select images and a template to create a customized reports. Created reports can be saved/edited in Microsoft Office® formats. Various imaging applications using 4-under low vacuum status. Charge-up reduction mode Charge on a sample can be reduced by one-click. Image a variety of materials under low vacuum condition The images show observations of non-conductive samples such as ink toner particles and a hydrated leaf surface. Innovative secondary-election detector to obtain surface detail with non-conductive samples at lower vacuum conditions The TM4000Plus II can observe not only conductive samples, but also non-conductive or hydrated samples without sample preparation. Switching between BSE and SE can be performed easily.

Exhibitions

Meet this supplier at the following exhibition(s):

analytica 2024
analytica 2024

9-12 Apr 2024 München (Germany) Hall A2 - Stand 113

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    36th Control 2024
    36th Control 2024

    23-26 Apr 2024 Stuttgart (Germany) Stand 7103

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    *Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.