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Magnification: 3,000,000 unit
Resolution: 0.8, 0.4, 1.2 nm
... to 0.7 sr can be mounted close to the sample for high-resolution elemental analysis in both SEM and STEM mode. Product features: - SEM-STEM combination with ExB-filtered SEM signal and scattering ...
Hitachi High-Tech Europe GmbH
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.9, 0.6 nm
... performance - without the need for a decelerating field on the sample - from 100V (10V option) up to 30kV acceleration voltage. EDX analysis and high-resolution imaging with all detectors are possible at 6mm working distance - Reliable ...
Hitachi High-Tech Europe GmbH
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.7, 0.6 nm
... for optimum light element analysis. These can be used with the SU8600 in the entire beam energy range up to 30keV, and at the shortest working distances from 4 mm due to the magnetic immersion lens. Or you could combine the SEM ...
Hitachi High-Tech Europe GmbH
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.9, 0.8 nm
The SU7000 is ideal for large or heavy samples and for integrating a wide range of accessories. These accessories include analytical detectors or stage attachments for in-situ sample manipulation (stretching [tensile] / compression, heating/cooling, probing, ...
Hitachi High-Tech Europe GmbH
Magnification: 5 unit - 800,000 unit
Resolution: 15, 4, 3 nm
... overview: Colour navigation images of the sample plates cover the entire sample area observable by SEM - Carefree operation - collisions between the stage and SEM components are virtually eliminated by automatically ...
Hitachi High-Tech Europe GmbH
Magnification: 6 unit - 800,000 unit
Resolution: 4, 15 nm
... FlexSEM II is a table-top / compact SEM for imaging tasks that go beyond the performance of conventional table-top SEMs. It’s the ideal system for anyone who doesn’t want to invest in a classic SEM, but also doesn’t want to compromise ...
Hitachi High-Tech Europe GmbH
Magnification: 10 unit - 250,000 unit
... overview. This can be supplemented locally by SEM photo snapshots. Product features: - EDX with 30mm2 or 60mm2 sensor size can be fully integrated, immediate switching between observation and element analysis - 4 ...
Hitachi High-Tech Europe GmbH
Magnification: 1 unit - 330 unit
Resolution: 10 nm
... ul>
Shimadzu France
... acquisition and analysis tailored to MS imaging studies.
Features
- Combined
Shimadzu France
... different applications in Haematology and Cytology. The requirements set on any routine microscope for everyday work needs careful focus on each microscope detail. The updated BA310 is equipped with a flexible light ...
... UNITRON’s new MEC4 inverted metallurgical microscope is designed for the examination and analysis of metallurgical samples and prepped material for the automotive, aerospace, medical device and electronics ...
Unitron
... Versamet 4 is a new inverted metallurgical microscope designed to support a variety of observation methods including brightfield, brightfield/darkfield, polarized light and DIC. This versatile and configurable microscope ...
Unitron
... The EXAMET-5 is a new industrial metallurgical microscope designed for brightfield, material science applications, metal manufacturing, metallurgy, fabrics/textiles, wafers, optoelectronics, composites and microelectronics. The advanced ...
Unitron
Magnification: 0 unit - 4 unit
... with the introduction of its new CFM Series Microscope. With the design assistance of police organizations, forensic scientists and educators in the field of forensic science UNITRON’s CFM Series Microscope offers unparalleled ...
Unitron