Performance & Power in a Flexible Platform
Hitachi High-Tech's scanning electron microscopes SU3800/SU3900 deliver both operability and expandability. The operator can automate many operations and efficiently utilize their high performance. The SU3900 is equipped with a large multipurpose specimen chamber to accommodate observation of large samples.
1.Substantially Larger Specimen Chamber Accommodates Oversized and Heavy Samples
■Robust Stage for Flexibility in Sample Size, Shape, and Weight
• The specimen exchange sequence prevents potential damage to the system or the sample.
• Exchange the specimens without venting the specimen chamber, improving throughput.
• Increase sample manipulation with Stage Free Mode*.
• The Chamber Scope enhances the safety of stage movements*.
■Increased Viewing Area—SEM MAP Expands the Boundaries of Sample Navigation
• Integrated in-chamber camera display
• Easily navigate the entire observable area
• Detector-oriented rotation
2.Evolution of the Market—Improved Automatic Functions for Operators of Any Skill Level
■Multiple Modes of Operation
■ Automatic Functions for Operators of Any Skill Level
Improved auto algorithms—3X faster (compared with the Hitachi Model S-3700N)
Improved auto focus function
Features of our proprietary Intelligent Filament Technology (IFT):
■Multi Zigzag enables wide-area observation across multiple areas.
■Report Creator generates reports of acquired data.
3.Integrated Solutions for Various Applications
■A Variety of Accessories Mountable onto Any of the 20 Ports in the Innovative SU3900 Specimen Chamber.
■SEM/EDS Integration System*