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... • - Quick, confident decision making based on reliable information about the material, both visual and chemical. No SEM sample preparation required Why does materials analysis with the DM6 M LIBS ...
Leica Microsystems GmbH
... on the latest LED technology and is fully integrated into the microscope. The low heat radiation and integration into the stand ensures that there is an optimal airflow around the microscope. The long lifetime yet extremely ...
Leica Microsystems GmbH
... Whether it be minerals, plastics and polymers, drugs and pharmaceuticals, or pigments and cement, with our polarization microscopes you will see what interests you most as a researcher or in quality assurance. Depending on your application, ...
Leica Microsystems GmbH
Weight: 32, 14, 20 kg
Length: 240, 458.5 mm
Width: 293.5, 429 mm
... advanced optical microscopy for materials analysis and metallography. Being a complete material laboratory solution, Axioscope is also the first choice from an economic point of view. Turnkey solution for ...
ZEISS Métrologie et Microscopie Industrielle
... Investigate, develop and analyze materials, especially metallographic specimens, in no time at all with ZEISS Axio Observer. Take advantage of its inverted design. Axio Observer combines the quality of ZEISS optics with automated components. ...
ZEISS Métrologie et Microscopie Industrielle
... comprehensive range of available options, EVO can be tailored precisely to your requirements, whether you are in life sciences, material sciences, or routine industrial quality assurance and failure analysis. Versatile solution ...
ZEISS Métrologie et Microscopie Industrielle
Magnification: 20 unit - 8,000,000 unit
Resolution: 0.08, 0.1 nm
... Cs-corrector, the surface can be visualised with atomic resolution. The routine and fast switching between TEM and STEM makes daily work with a fully automated Cs corrector easy, even for beginners in the field of TEM. Product features: - ...
Magnification: 5 unit - 800,000 unit
Resolution: 15, 4, 3 nm
... overview: Colour navigation images of the sample plates cover the entire sample area observable by SEM - Carefree operation - collisions between the stage and SEM components are virtually eliminated by automatically ...
Magnification: 6 unit - 800,000 unit
Resolution: 4, 15 nm
... FlexSEM II is a table-top / compact SEM for imaging tasks that go beyond the performance of conventional table-top SEMs. It’s the ideal system for anyone who doesn’t want to invest in a classic SEM, but also doesn’t want to compromise ...
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- AIRsight - Infrared/Raman Microscope (brochure)
- AIRsight Infrared/Raman Microscope - For Researchers (brochure)
- AIRsight Infographics (PDF)
- FTIR Series and Infrared/Raman Microscope
Magnification: 4 unit - 100 unit
Weight: 17, 14 kg
... eyepiece observation and digital imaging.
Applications
Mineralogy, petrography,
materials science and analysis of optically active
materials. Suitable for both transmitted and reflected polarizing observations, ...
Nikon Metrology
Magnification: 10 unit - 220 unit
Resolution: 650 nm
Weight: 137 g
With the use of the latest, cutting-edge optics, a brand new 5 megapixel sensor and several special features, the Dino-Lite AM7915MZT is a marvel of technology and the best choice for the high-demanding professional. The Dino-Lite AM7915MZT offers superb ...
Dino-Lite Europe/IDCP BV
Magnification: 10 unit - 220 unit
Weight: 110 g
Length: 11.9 cm
... The Dino-Lite AM73915MZT is part of the High Speed range with USB 3.0 connection. It offers superb uncompressed image quality and color reproduction in a robust, compact and appealing metal housing. USB 3.0 adds a new transfer mode called "SuperSpeed" ...
Dino-Lite Europe/IDCP BV
Magnification: 10 unit - 140 unit
Weight: 110 g
Length: 11.9 cm
... The Dino-Lite AM73915MZTL is a Long Working Distance model that is part of the High Speed range with USB 3.0 connection. It offers superb uncompressed image quality and color reproduction in a robust, compact and appealing metal housing. USB 3.0 adds ...
Dino-Lite Europe/IDCP BV
Magnification: 40 unit - 800 unit
... petri dishes. With an upright microscope, the lens is under the specimen and the condenser above the specimen, which is particularly suitable for viewing on microscope slides. In an inverted microscope, ...
Magnification: 40 unit - 800 unit
... connections and other metals. It is also ideal for quality assessment, raw material analysis and examining metal structures following heat treatment. This metallurgical microscope is particularly well suited for laboratory ...
Magnification: 45 unit
... A robust zooming stereo microscope for the professional examination of electronics, precision engineering, plastics and medical products. The microscope is used for inspection, assembly, analysis, for soldering and polishing ...
Magnification: 160 unit - 350,000 unit
Resolution: 8, 6, 5, 20, 10 nm
Weight: 50 kg
... Pro G6 Desktop SEM with integrated EDS for comprehensive X-ray elemental analysis. features Entry-level SEM with high-brightness CeB6 source, suited to educational and basic R& D tasks. User friendly ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Magnification: 160 unit - 175,000 unit
Resolution: 0 nm - 15 nm
Weight: 50 kg
... most advanced model, combining all the features of the Phenom Pro G6 Desktop SEM with integrated EDS for comprehensive X-ray elemental analysis. Features Desktop SEM with a durable electron source and exceptional ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Magnification: 160 unit - 200,000 unit
Resolution: 0 nm - 10 nm
Weight: 75 kg
... Thermo Scientific Phenom ParticleX Battery Desktop SEM offers outstanding speed and precision. It delivers lightning-fast throughput that’s up to 10 times faster than traditional scanning electron microscopes, enabling ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Resolution: 0.5 µm
... micrometer (μm). High-resolution, high-contrast X-ray microscope The new nano3DX allows you see into many types of samples, including those that have low absorption contrast, for example CFRP, or denser materials like ...
Magnification: 10 unit
Weight: 7,488 g
Length: 440 mm
... The KERN OKM is an excellent metallurgical reflected light microscope, e.g. for surface quality testing of raw materials and finished products in industry The strong, continuously dimmable 5 W-LED iillumination unit ...
Magnification: 40 unit - 300,000 unit
Resolution: 4 nm - 8 nm
Weight: 120 kg
... Benchtop Scanning Electron Microscope CEM3000A is a precision instrument designed for microscale morphology observation and analysis of material surfaces. Equipped with a secondary electron probe and a backscattered electron ...
... The new "Machine Vision Microscope" (MVM) is a purely digital microscope with all the features that make a microscope. It has an apochromatically highly corrected microscope objective ...
... analyzes. Entry-level inverted microscope for general purpose applications for hardness testing. Industrial and materials science inverted microscope especially designed for opaque specimens (including ...
... The Oxion Inverso inverted microscopes for material science are intensively used for observation of large pieces of material made from metal, wood, plastics and more The Oxion Inverso is available ...
... Versatile nanoanalytical FIB-SEM to expand your materials research capabilities • High precision micro sample preparation • Ultra-high resolution field-free SEM imaging and nanoanalysis • Extended ...
Magnification: 300,000 unit
Resolution: 4, 7, 3 nm
Weight: 480 kg
... Brightness & Contrast, Auto Focus, Automatic Stigmator The CIQTEK SEM3200 SEM Microscope is an excellent general-purpose Tungsten Filament Scanning Electron Microscope (SEM) with outstanding overall ...
CIQTEK Co., Ltd.
... HL401W metallographic microscope is a trinocular upright metallographic microscope, which can provide superior image quality and stable operating system, easy operation and complete accessories. Widely used in teaching ...
Shanghai Hualong Test Instruments Corporation
... Measures particle length, breadth, and height where Motorized Microscope functions – except for the scanning stage and motorization of the focus drive – are not required. The high resolution optics ensure that particles down to 5 μm can ...
Weight: 8, 20 kg
Length: 410 mm
Width: 219 mm
... Your routine reflected light microscope for materials analysis. Reliable Microstructure and Material Defect Analysis – in Comfortable Conditions Choose the best configuration for your application ...
... Usage： INSPECT series measuring metallurgical microscope are widely used in semiconductor packages, solder pads, loop height, FPD panels (LCM), wafer level CSPS and so on. Features: ■ High-precision marble base, table and column to ensure ...
Leader Precision Instrument Co. Ltd
Length: 600 mm
Width: 560 mm
Height: 640 mm
... Applications Used for testing the fiber diameter and content of animal wool,lotion and hemp;constitutde by computer,pick-up heed microscope. Standards:GB/T10685、GB/T16988、FZ/T30003、SN/T0756 Technical parameter 1.Measuring Range:2～200μm 2.Pick-up ...
... Versamet 4 is a new inverted metallurgical microscope designed to support a variety of observation methods including brightfield, brightfield/darkfield, polarized light and DIC. This versatile and configurable microscope ...
Magnification: 10, 4, 100, 40 unit
Weight: 6.8 kg
Length: 29.2 cm
... This full-featured research microscope offers durable, rugged construction and adaptability with ergonomic comfort at an affordable price. Numerous high-quality features, including humidity and climate protected eyepieces ...
Ken-A-Vision
Magnification: 2,500 unit - 6,000 unit
Weight: 10.8 kg
... features. Capture Details That Other Microscopes Overlook Combining lighting from multiple directions allows for clear observation of subtle surface conditions that were impossible to see with optical microscopes ...
... spatial distribution and time evolution of the magnetization state in magnetic materials and devices, and is suitable for testing and product development of magnetic materials and spintronic devices. The magneto-optical ...
Resolution: 0.02 µm
... Product overview
The Atomic Force
Microscope (wafer-level AFM) is a high-resolution scanning probe instrument designed to characterize three-dimensional surface morphology and multifunctional properties of conductors, semiconductors ...
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