FE-SEM microscope Apreo ChemiSEM

for analysisfor non-metallic inclusion inspectioneducational

Overview
The Thermo Scientific Apreo ChemiSEM System is an analytical scanning electron microscope (SEM) delivering nanometer and sub‑nanometer resolution at an analytical working distance of 10 mm. The field emission gun (FEG) source and advanced optics enable high‑resolution imaging of beam‑sensitive materials, composites, magnetic samples and nanomaterials while maintaining integrated analytical performance for correlated structural and compositional analysis.

Integrated analytical capabilities
ChemiSEM Technology integrates SEM imaging with energy dispersive X‑ray spectroscopy (EDS) to provide live, always‑on quantitative elemental mapping alongside imaging. The system also supports EBSD for crystallographic and orientation analysis, enabling multi‑modal workflows that combine morphological, elemental and crystallographic data for efficient materials characterization.

Key system features

• Field emission gun (FEG) for high‑resolution imaging at nanometer and sub‑nanometer scales.
• Analytical working distance: 10 mm, optimized for integrated SEM/EDS/EBSD performance.
• Integrated EDS for live quantitative elemental mapping; EBSD support for crystallographic analysis.
• Self‑aligning optics and SmartAlign technology to maintain automatic alignment and imaging readiness.
• Smart Frame Integration (SFI) operating in real time to dynamically optimize detector settings for high‑quality images.
• Automation features including autofocus and autostigmation to reduce manual alignment and speed acquisitions.
• Multiple detector options: Everhart‑Thornley secondary electron detector, backscattered electron detector, cathodoluminescence detector and low‑vacuum detector options for beam‑sensitive samples.
• Electrostatic final lens with optional magnetic immersion for highest‑resolution needs.
• Large motorized stage with multi‑sample holder and fast pump down to improve throughput and operator productivity.

Applications
The Apreo ChemiSEM System is suited to materials science and industrial R&D applications including characterization of composites, polymers, nanomaterials, catalysis materials, magnetic samples and other beam‑sensitive or charging specimens. Low acceleration voltage operation enables surface‑sensitive and delicate sample characterization.

Resources and media
Available resources include downloadable brochures, an image gallery and an introduction video presenting system capabilities (teaser title: "Introducing the new Apreo ChemiSEM System").

Notes
For Research Use Only. Not for use in diagnostic procedures.

Technical specifications

• Commercial name: Apreo ChemiSEM System
• Manufacturer / brand: Thermo Scientific
• Electron source: Field Emission Gun (FEG)
• Analytical working distance: 10 mm
• Integrated techniques: SEM imaging, EDS (energy dispersive X‑ray spectroscopy), EBSD support
• Live quantitative elemental mapping via ChemiSEM Technology
• Detectors: Everhart‑Thornley SE detector, backscattered electron detector, cathodoluminescence detector, low‑vacuum detector options
• Imaging enhancements: Smart Frame Integration (SFI), SmartAlign, autofocus, autostigmation
• Optics: electrostatic final lens with optional magnetic immersion
• Sample handling: large stage, multi‑sample holder, fast pump down
• Suitable sample types: beam‑sensitive materials, polymers, composites, magnetic samples, nanomaterials