THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE: Metrology - Laboratory - DirectIndustry

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THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE

All THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE products

Desktop scanning electron microscopes

SEM microscope Phenom XL G3

multipurpose laboratory for quality control

X-ray microscope

X-ray microscope Phenom Pro G6

for analysis educational for quality control

SEM microscope Phenom ProX G6

for analysis for research desktop

X-ray microscope

X-ray microscope Phenom Pure G6

educational for quality control for materials research

battery microscope

battery microscope Phenom ParticleX

scanning electron for analysis for quality control

steel inspection microscope

steel inspection microscope

X-ray for analysis metallurgical

X-ray microscope

X-ray microscope Phenom ParticleX TC

multipurpose for analysis industrial

X-ray microscope

X-ray microscope Phenom ParticleX GSR

for analysis for quality control for materials research

SEM microscope Phenom ParticleX AM

for analysis measuring for quality control

electron microscope

electron microscope Phenom Pharos G2

educational for quality control for materials research

Scanning electron microscopes

X-ray microscope

X-ray microscope Axia ChemiSEM

for analysis for quality control for materials analysis

scanning electron microscope

scanning electron microscope Verios 5 XHR

metrology for materials research for semiconductors

SEM microscope Quattro ESEM

for quality control for materials research industrial

scanning transmission electron microscope

scanning transmission electron microscope Volumescope 2

for materials research 3D in-situ

SEM microscope Apreo 2

for analysis metrology for quality control

X-ray microscope

X-ray microscope Apreo ChemiSEM

for analysis biomedical for quality control

DualBeam (FIB-SEM) instruments

SEM microscope Helios 5

for quality control for materials research 3D

STEM microscope

STEM microscope Helios Hydra

for quality control for materials research 3D

focused ion beam scanning electron microscope

focused ion beam scanning electron microscope Helios 5 DualBeam

for materials research 3D high-resolution

focused ion beam scanning electron microscope

focused ion beam scanning electron microscope Helios 5 PFIB DualBeam

for materials research for semiconductors for materials

FIB/SEM microscope

FIB/SEM microscope Scios 3

for analysis for quality control for research

electron microscopes

scanning transmission electron microscope

scanning transmission electron microscope Spectra Ultra

for quality control for materials research for semiconductors

STEM microscope

STEM microscope Spectra 200

for quality control for materials research for semiconductors

TEM microscope Spectra 300

for materials research for semiconductors high-resolution

TEM microscope Talos F200i

for quality control for materials research 3D

X-ray microscope

X-ray microscope Talos F200X G2

for analysis for research industrial

X-ray microscope

X-ray microscope Talos F200S G2

for analysis for quality control for materials research

X-ray microscope

X-ray microscope Talos 12

for quality control for research for materials research

TEM microscope Talos F200C

for quality control for materials research 3D

TEM microscope Themis ETEM

for quality control for materials analysis in-situ

focused ion beam system

focused ion beam system

XPS instruments

X-ray photoelectron spectrometer

X-ray photoelectron spectrometer K-Alpha XPS

optical data acquisition alpha

AES spectrometer

AES spectrometer ESCALAB QXi XPS

X-ray photoelectron data acquisition high-resolution

UV spectrometer

UV spectrometer Nexsa G2 XPS

X-ray X-ray photoelectron data acquisition

Software

data management software

data management software Athena

imaging tracing interface

analysis software

analysis software Avizo

programming visualization quality

automation software

automation software AsbestoMetric

analysis image acquisition verification

creation software

creation software AutoTEM 5

automation software

automation software AutoScript 4

imaging instrument SEM

analysis software

analysis software Velox

quality control mapping

visualization software

visualization software Inspect

tracking digital tomography alignment

automation software

automation software Maps 3

data acquisition data collection analysis

rapid prototyping software

rapid prototyping software NanoBuilder

CAD control planning

imaging software suite

imaging software suite ProSuite

for remote access SEM automated

analysis software

analysis software PoroMetric

scheduling SEM automated

particle analysis software

particle analysis software

analysis development quality

analysis software

analysis software Phenom Quartz

imaging acquisition SEM

EBSD software Auto Slice & View 5

acquisition mapping SEM

measurement software

measurement software Phenom FiberMetric

statistical SEM automated

data collection software

data collection software

imaging storage sampling

mapping software

mapping software

analysis acquisition chemical

interface software

interface software

programming control acquisition

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