SEM microscope Phenom ParticleX AM

for analysismeasuringfor quality control

If you want to step up the quality and precision of your additive powder testing—with more detailed analysis and accurate size measurements—the Thermo Scientific Phenom ParticleX AM Desktop SEM can help. For both powder-bed and powder-fed additive manufacturing (AM) processes, it can help you analyze the critical characteristics of metal powders at the microscale. Plus, it allows you to work with up to 49 samples simultaneously. But what really sets this system apart is the integrated Thermo Scientific Perception Software, which automatically finds and identifies debris, spherical or elongated particles, and other particles, thus proving the quality of the powder. It then delivers concise industrial reports that turn raw data into clear and unbiased answers for you and your team. The Phenom ParticleX AM Desktop SEM comes with integrated energy-dispersive X-ray spectroscopy (EDS) for advanced compositional analysis. And you can add a secondary electron detector (SED), which collects low-energy electrons from the top surface layer of the sample to provide detailed surface information. overview Meet industrial quality standards with confidence With the Phenom ParticleX AM Desktop SEM, you can analyze the composition and size of particles as well as shape parameters (diameter, perimeter, aspect ratio, roughness, and Feret diameter)—all at the microscale and with far greater precision than other technologies. Industry-leading throughput The Phenom ParticleX AM Desktop SEM delivers fast throughput, so you can do more with the microscope and increase production cycle time.