X-ray microscope Phenom ParticleX TC

multipurposefor analysisindustrial

Keeping it clean in an industrial setting is easier said than done, especially in demanding manufacturing environments like automotive. Compared to traditional optical microscopes, our Thermo Scientific Phenom ParticleX TC Desktop SEM not only enables you to conduct more detailed compositional analysis at the microscale but also allows you to reliably detect and analyze translucent particles, such as glass, that are often missed by other systems. But what really sets this compact system apart is the integrated Thermo Scientific Perception Automation Software, which automatically analyzes and identifies hard particles like SiO2 or corundum that can increase the wear rate of products such as gearboxes. Then Perception Software matches the amount and type of particles found to the relevant cleanliness specifications. Finally, the Phenom ParticleX TC Desktop SEM delivers concise industrial reports that turn raw data into clear and unbiased answers for you and your team, thus enabling you to comply with quality specifications, including German VDA standards. This system also comes with our integrated energy-dispersive X-ray spectroscopy (EDS) for advanced compositional analysis. And you can also add a secondary electron detector (SED) to collect low-energy electrons from the top surface layer of the sample, which is ideal for gaining detailed sample surface information. Meet industrial quality standards with confidence This system helps you to answer the enduring question: Is my product clean enough? Compared to optical microscopy, it raises the stakes in both the imaging quality and the scope of particle analysis, giving you confidence in your results.