{{product.productLabel}} {{product.model}}
{{#if product.featureValues}}{{product.productPrice.formattedPrice}} {{#if product.productPrice.priceType === "PRICE_RANGE" }} - {{product.productPrice.formattedPriceMax}} {{/if}}
{{#each product.specData:i}}
{{name}}: {{value}}
{{#i!=(product.specData.length-1)}}
{{/end}}
{{/each}}
{{{product.idpText}}}
{{product.productLabel}} {{product.model}}
{{#if product.featureValues}}{{product.productPrice.formattedPrice}} {{#if product.productPrice.priceType === "PRICE_RANGE" }} - {{product.productPrice.formattedPriceMax}} {{/if}}
{{#each product.specData:i}}
{{name}}: {{value}}
{{#i!=(product.specData.length-1)}}
{{/end}}
{{/each}}
{{{product.idpText}}}
Magnification: 160 unit - 200,000 unit
Resolution: 0 µm - 10 µm
... A proven large chamber SEM for rapid materials imaging and analysis The Thermo Scientific Phenom XL G3 Desktop SEM sets the stage for faster and more efficient quality control and failure analysis. Its larger stage ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Magnification: 160 unit - 350,000 unit
Resolution: 8, 6 nm
... combining all the features of the Phenom Pro G6 Desktop SEM with integrated EDS for comprehensive X-ray elemental analysis. Features For advanced analytical capabilities, the Phenom ProX G6 Desktop SEM integrates ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Magnification: 160 unit - 200,000 unit
Resolution: 0 nm - 10 nm
Weight: 75 kg
... Thermo Scientific Phenom ParticleX Battery Desktop SEM offers outstanding speed and precision. It delivers lightning-fast throughput that’s up to 10 times faster than traditional scanning electron microscopes, ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
... The instruments of the EVO family combine high performance scanning electron microscopy with an intuitive, user-friendly experience that appeals to both trained microscopists and new users. With its comprehensive range ...
Magnification: 5 unit - 800,000 unit
Resolution: 15, 4, 3 nm
... platform. Product features: - Highly efficient Hitachi detectors: -- Secondary electron detector for high vacuum -- 5-segment semiconductor backscattered electron detector for high and low vacuum, selection ...
Magnification: 6 unit - 800,000 unit
Resolution: 4, 15 nm
... High-resolution electron optics with beam energies between 300eV and 20keV - High and adjustable low vacuum up to 100Pa - SE and 4+1 segment backscatter detector standard, low vacuum SE optional (UVD); can also be used for cathodoluminescence ...
Magnification: 10 unit - 250,000 unit
... Designed as a logical extension of optical stereo microscopy, the TM4000 III is an entry-level device for scanning electron microscopy. It allows you to image samples in the shortest possible time with good resolution, ...
... Clear visibility promotes new discovery Nowadays, not only resolution and analytical performance on the nanometer order, but also throughput in data acquisition are considered important. The newly born JSM-IT710HR is the fourth-generation model of ...
Jeol
Magnification: 40 unit - 300,000 unit
Resolution: 4 nm - 8 nm
Weight: 120 kg
... Benchtop Scanning Electron Microscope CEM3000A is a precision instrument designed for microscale morphology observation and analysis of material surfaces. Equipped with a secondary electron ...
... TESCAN VEGA’s 4th generation Scanning Electron Microscope (SEM) with tungsten filament electron source combines SEM imaging and live elemental composition analysis in ...
Tescan GmbH
Magnification: 300,000 unit
Resolution: 4, 7, 3 nm
Weight: 480 kg
... Automatic Stigmator The CIQTEK SEM3200 SEM Microscope is an excellent general-purpose Tungsten Filament Scanning Electron Microscope (SEM) with outstanding overall ...
CIQTEK Co., Ltd.
Magnification: 1,000,000 unit
Resolution: 3 nm
... -user Scanning Electron Microscope(SEM). It excels in versatility and flexibility by combining high performance in all SEM modes & Particle counter with ease of operation in a multi-user ...
... provides documentation of the surface of a component to reveal irregularities. Scanning Electron Microscope | SEM | Microhone | CNC Tooling A Scanning Electron ...
... for improved image quality and MFCI for enhanced image quality in the most demanding applications. ECHO VS is the ultimate scanning acoustic solution for molded flip chip, CSP, MCM, stacked die, MUF and other advanced packaging technologies. Detects ...
the best suppliers