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- Scanning electron microscope
Scanning electron microscopes
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Resolution: 3, 7, 8 nm
SEM EDS instrument that is flexible, easy to use, and offers instantaneous, quantitative elemental analysis. SEM imaging and EDS elemental analysis Even though scanning electron ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Resolution: 1, 0.7, 0.6 nm
Scanning electron microscopy characterization of nanomaterials with sub-nanometer resolution and high material contrast. Verios 5 XHR Scanning Electron Microscope The ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Resolution: 1.3, 1, 0.8, 3 nm
Environmental scanning electron microscope (ESEM) for the study of materials in their natural state. Quattro Environmental Scanning Electron Microscope The ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Magnification: 5 unit - 800,000 unit
Resolution: 15, 4, 3 nm
Performance & Power in a Flexible Platform Hitachi High-Tech's scanning electron microscopes SU3800/SU3900 deliver both operability and expandability. The operator can automate many ...
Magnification: 6 unit - 800,000 unit
Resolution: 4, 5, 15 nm
... available in a full-sized SEM. This SEM runs on clean energy for an economical analytical tool, without compromising performance. The FlexSEM 1000 II Scanning Electron Microscope ...
Magnification: 10 unit - 25,000,054 unit
Weight: 54 kg
Length: 614, 617 mm
... innovation and cutting-edge technologies which redefine the capabilities of a tabletop microscope. This new generation of the long-standing Hitachi tabletop microscopes (TM) integrates ease of use, optimized ...
The ZEISS Sigma family combines field emission scanning electron microscope (FE-SEM) technology with an excellent user experience. Structure your imaging and analysis routines and increase ...
ZEISS Métrologie industrielle
In an industrial quality, failure analysis, or research environment, the scanning electron microscope (SEM) is the solution of choice for metallography and failure analysis applications, ...
ZEISS Industrial Metrology
Magnification: 300,000 unit
Resolution: 3, 4, 8 nm
Weight: 480 kg
CIQTEK SEM3200 is a high-performance tungsten filament scanning electron microscope. It has excellent image quality, low vacuum mode compatibility, high resolution images in different ...
Magnification: 1 unit - 2,500,000 unit
Resolution: 0.6 nm
Weight: 400 kg
SEM5000X is an ultra-high resolution Field Emission Scanning Electron Microscope(FE-SEM) with breakthrough resolution of 0.6 nm@15 kV and 1.0 nm@1 kV. Benefited from upgraded column ...
Magnification: 3,500 unit - 100,000 unit
... function which decelerates illuminated electron beam and accelerated electron signal using biased voltage for sample. New Backscattered Electron Detector The newly developed ultra ...
Jeol
TESCAN VEGA’s 4th generation Scanning Electron Microscope (SEM) with tungsten filament electron source combines SEM imaging and live elemental composition ...
Tescan GmbH
... for improved image quality and MFCI for enhanced image quality in the most demanding applications. ECHO VS is the ultimate scanning acoustic solution for molded flip chip, CSP, MCM, stacked die, MUF and other advanced ...
Magnification: 1,000,000 unit
Resolution: 3 nm
... -user Scanning Electron Microscope(SEM). It excels in versatility and flexibility by combining high performance in all SEM modes & Particle counter with ease of operation ...
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