Jeol: Metrology - Laboratory - DirectIndustry

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Scientific Instruments

electron microscope

electron microscope JEM-3300

laboratory bright field dark field

electron microscope

electron microscope JEM-Z300FSC

for analysis small cold field emission

electron microscope

electron microscope JEM-ARM300F2

for analysis floor-standing cold field emission

transmission electron microscope

transmission electron microscope JEM-ARM200F

for analysis cold field emission digital camera

transmission electron microscope

transmission electron microscope JEM-F200

for analysis bright field dark field

transmission electron microscope

transmission electron microscope JEM-2100Plus

biomedical medical multipurpose

electron microscope

electron microscope JEM-2200FS

for analysis digital camera ultra-high resolution

electron microscope

electron microscope JEM-1400Flash

for analysis high-resolution observation

energy dispersive X-ray fluorescence spectrometer

energy dispersive X-ray fluorescence spectrometer JED-2300T

for analysis handheld SDD

automation software

automation software EM-05500TGP

acquisition process TEM tomography

scanning electron microscope

scanning electron microscope JSM-IT710HR

for analysis secondary electron high-resolution

scanning electron microscope

scanning electron microscope JSM-IT210

for analysis compact automatic

scanning electron microscope

scanning electron microscope JSM-IT200

for analysis CCD automatic

scanning electron microscope

scanning electron microscope JCM-7000

for analysis 3D benchtop

X-ray emission spectrometer

X-ray emission spectrometer SXES

X-ray laboratory measurement

scanning electron microscope

scanning electron microscope miXcroscopy™

laboratory floor-standing high-resolution

analysis software

analysis software SMILE VIEW™

interface visualization reporting

metal polishing machine

metal polishing machine IB-19520CCP

for specimen preparation surface planar

metal polishing machine

metal polishing machine IB-19540CP

for specimen preparation industrial automatic

FIB/SEM microscope

FIB/SEM microscope JIB-PS500i

laboratory 3D high-resolution

FIB/SEM microscope

FIB/SEM microscope JIB-4700F

for analysis floor-standing EBSD

FIB/SEM microscope

FIB/SEM microscope CRYO-FIB-SEM

industrial fluorescence

photoelectron spectrometer

photoelectron spectrometer JAMP-9510F

laboratory chemical MCP

photoelectron spectrometer

photoelectron spectrometer JPS-9030

X-ray process measurement

X-ray fluorescence spectrometer

X-ray fluorescence spectrometer JSX-1000S

laboratory optical SDD

FT-NMR spectrometer

FT-NMR spectrometer JNM-ECZL series

laboratory measurement automatic

frequency probe

frequency probe ROYALPROBE™ HFX

NMR for analysis polymer

NMR probe UltraCOOL probe

measurement for analysis automatic

superconducting magnet

superconducting magnet JJ

nitrogen vessel

nitrogen vessel

cryogenic recovery industrial

automatic sample changer

automatic sample changer ASC30

NMR software Delta

interface automation data acquisition and analysis

electronic paramagnetic resonance spectrometer

electronic paramagnetic resonance spectrometer JES-X3 series

laboratory measurement automatic

gas chromatograph

gas chromatograph JMS-T2000GC

laboratory GC/MS time-of-flight

gas chromatograph

gas chromatograph JMS-Q1600GC

laboratory coupled to a mass spectrometer quadrupole

mass spectrometer

mass spectrometer JMS-TQ4000GC

measurement high-sensitivity high-speed

analysis software

analysis software msFineAnalysis AI

process industrial chemical

scanning electron microscope

scanning electron microscope JSM-IT810

inspection Schottky field emission EBSD

electron microscope

electron microscope JEM-120i

inspection automated observation

Semiconductor Equipment

electron beam lithography system

electron beam lithography system JBX-8100FS

laser lithography system

laser lithography system JBX-9500FS

electron beam lithography system

electron beam lithography system JBX-3200MV

electron beam lithography system

electron beam lithography system JBX-3050MV

scanning electron microscope

scanning electron microscope JSM-IT800 series

for analysis 3D floor-standing

Industrial Equipment

metal additive manufacturing machine

metal additive manufacturing machine JAM-5200EBM

industrial powder bed fusion

electron beam source

electron beam source BS-60070DEBS

surface treatment plasma source

surface treatment plasma source BS-80011BPG

film thickness gauge

film thickness gauge BS-04

portable optical

powder feeder TP-99260FDR

automatic continuous manual

RF atmospheric plasma generator

RF atmospheric plasma generator TP

multifunctional synthesis platform

multifunctional synthesis platform TP-40020NPS

Medical Equipment

blood analyzer JCA-ZS050 series

process laboratory trace

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