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Electron microscope JEM-120i
inspectionautomatedobservation

Electron microscope - JEM-120i - Jeol - inspection / automated / observation
Electron microscope - JEM-120i - Jeol - inspection / automated / observation
Electron microscope - JEM-120i - Jeol - inspection / automated / observation - image - 2
Electron microscope - JEM-120i - Jeol - inspection / automated / observation - image - 3
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Characteristics

Type
electron
Technical applications
inspection
Other characteristics
automated, observation
Magnification

Max.: 1,500,000 unit

Min.: 50 unit

Resolution

0.14 nm, 0.2 nm

Description

With the drastic reduction in size, the JEM-120i has a filament replacing position and specimen holder insertion position lower than existing instruments. A newly developed cartridge type filament unit helps make filament replacement easy and safe for anyone. The instrument has an LED light on its front and its color changes depending on the state of the TEM. You can determine its operating state at a distance. It takes only 4 steps from loading a specimen to completing observation. After inserting the specimen holder, clicking the Start Button automatically performs observation preparation operations such as voltage increase and emission start. A wide area image is captured at the same time. So, clicking the target field will move the stage to the clicked position. Since standard "Butler mode" assists data acquisition, even a beginner can capture data easily. When observation completes, you can exchange the sample holder while keeping the emission on. Seamless observation without switching magnification mode The JEM-120i is equipped with an enhanced TEM control system and fully automated apertures, eliminating the need for switching magnification modes and selecting an aperture. Observation operations can be performed more smoothly than with previous models. The JEM -120i supports a variety of retrofits. It also meets the need for additional functions after purchase. Application CryoNote Observation of biological specimen by JEM-1400Flash ー Flow from sample preparation to observation ー CLEMnote Wide Area Observation by Using SiN Window Chip

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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.