Jeol automated microscopes

1 company | 9 products
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electron microscope
electron microscope
JEM-Z300FSC

... a side-entry liquid nitrogen cooling stage and an automated specimen exchange system, is a cryo-electron microscope (cryo-EM) that enables observation of bio-molecules at cryo-temperature. The automated ...

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transmission electron microscope
transmission electron microscope
JEM-ARM200F

Resolution: 0.08 nm - 0.23 nm

... but also a low voltage of 30 kV. "NEOARM" is also equipped with an automated aberration correction system that incorporates JEOL’s new aberration correction algorithm for automatic fast and precise aberration correction. ...

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transmission electron microscope
transmission electron microscope
JEM-2100Plus

Resolution: 0.14 nm - 0.31 nm

... • Easy operation 64 bit Windows® compatible control software, TEM Center, is an intuitive user interface designed to maximize ease of operation. • Enhanced integration The TEM Center allows the user to control ...

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scanning electron microscope
scanning electron microscope
JSM-IT710HR

... high-resolution images. The JSM-IT710HR makes users want to pursue beyond what has been seen, due to ease of operation with enhanced automatic functions and improved observation performance from a new detector. *HR=High Resolution ...

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scanning electron microscope
scanning electron microscope
JSM-IT210

... by simply selecting the field of view. The JSM-IT210 is a new generation SEM that is compact and can be operated unattended. Features Guide from specimen exchange to automatic observation "Specimen Exchange Navi" 1. ...

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scanning electron microscope
scanning electron microscope
JSM-IT200

... operation from sample loading to area search, and SEM image observation. “Zeromag” for seamless transition from optical to SEM imaging, “Live Analysis”*2 for real time display of elemental analysis results, SMILE VIEW(TM) ...

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FIB/SEM microscope
FIB/SEM microscope
JIB-PS500i

... solutions to assist TEM specimen preparation. High throughput workflow is assured from specimen prepartion to TEM observation. Features TEM-LINKAGE The use of JEOL’s double tilt cartridge and TEM ...

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scanning electron microscope
scanning electron microscope
JSM-IT810

... SEM has never been easier with the JSM-IT810 series. SEM observation and EDS analysis can be automated by simply setting the analysis conditions and selecting the areas to measure. SEM Automatic ...

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electron microscope
electron microscope
JEM-120i

Magnification: 50 unit - 1,500,000 unit
Resolution: 0.14, 0.2 nm

... emission on. Seamless observation without switching magnification mode The JEM-120i is equipped with an enhanced TEM control system and fully automated apertures, eliminating the need for switching magnification modes ...

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Jeol
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