Observation microscopes

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STEM microscope
STEM microscope
Helios 5 Hydra

Resolution: 2, 5, 1, 4, 20 µm

... monochromated Thermo Scientific Elstar UC+ SEM Column to provide advanced focused ion- and electron-beam performance. Intuitive software and an unprecedented level of automation and ease-of-use allow observation ...

electron microscope
electron microscope
NE4000

... the exposed, upper layer metallization to complete the circuit and allow the electrons to flow through the interconnect. Observation of high resistance and shorts due to Seebeck effect is possible by using dual probes ...

opto-digital microscope
opto-digital microscope
AM7115MZTW

Magnification: 10 unit - 50 unit
Weight: 135 g
Length: 10.5 cm

Designed for macro-view observation, the 5MP Edge AM7115MZTW provides wide field-of-view while offering large depth-of-field within a magnification range of 10X-50X. With astonishing image quality and illumination flexibility ...

microscope with special lighting
microscope with special lighting
AM4117MT-G2FBW

Magnification: 10 unit - 220 unit
Length: 10.5 cm

... light and a 510-545nm emission bandpass filter range, AM4117MT-G2FBW is the ideal solution for the selective isolation and observation of samples with green fluorescence. The interchangeable caps provide adaptability ...

field emission scanning electron microscope
field emission scanning electron microscope
SEM5000

Magnification: 1 unit - 2,500,000 unit
Resolution: 1, 1.5, 0.8 nm
Weight: 950 kg

CIQTEK SEM5000 is a high-resolution, feature-rich field emission scanning electron microscope (FE-SEM, FEG SEM). Advanced column design, high voltage tunneling technology (SuperTunnel), low aberration non-leakage magnetic ...

focused ion beam scanning electron microscope
focused ion beam scanning electron microscope
DB500

Resolution: 3, 1.2 nm

CIQTEK DB500 is a Field Emission Scanning Electron Microscope with a Focused Ion Beam column for nano analysis and specimen preparation, which is applied with “SuperTunnel” technology, low aberration, and magnetic-free ...

inspection microscope
inspection microscope
B-510MET

Magnification: 5, 10, 20, 50 unit
Resolution: 2 µm
Weight: 12.3 kg

Observation mode: Brightfield, simple polarized light, oblique illumination on incident light. Epi-illumination and filters: X-LED8 with white 8 W LED (6.300 K) with brightness control. With aperture and field diaphragms, ...

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Optika Srl
TEM microscope
TEM microscope
JEM-ARM300F2

Weight: 100 kg

A New Atomic Resolution Electron Microscope has been released! The "GRAND ARM™2" has been upgraded. This new "GRAND ARM™2" enables observation at ultrahigh spatial resolution with highly sensitive analysis ...

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Jeol
optical microscope
optical microscope
UM 620 BD

Magnification: 50, 100, 200, 500 unit
Weight: 23 kg

... achromatic objectives long working distance PL L 5x/O.15BD WD=II mm (for DIC observation) PL L IOx/O.30BD WD=9.50mm (for DIC observation) PL L 20x/O.45BD WD=3.40mm (for DIC observation) PL ...

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echoENG
metallographic microscope
metallographic microscope
IMS20

Length: 242 mm
Width: 200 mm

... system and realize the functions of polarlight observation, dark field observation and so on. - The compact and stable high rigid main body fully embodies the vibration prevention requirements of the ...

metallurgical microscope
metallurgical microscope
MM1000A

Magnification: 10, 20, 50, 100 unit
Weight: 11 kg

■ For high magnification observation and metallurgical image analysis ■ Infinite optical system, can add accessories like polarizer, analyzer into optical path without image quality influence

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