FE-SEM microscope SEM5000Pro

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CIQTEK FESEM Microscope SEM5000Pro Specifications •Electron Optics Resolution：0.8 nm @ 15 kV, SE/1.2 nm @ 1.0 kV, SE Acceleration Voltage：0.02kV ~ 30 kV Magnificationn (Polaroid)：1 ~ 2,500,000 x Electron Gun Type：Schottky Field Emission Electron Gun •Specimen Chamber Camera：Dual Cameras (Optical navigation + chamber monitor) Stage Range：X: 110 mm, Y: 110 mm, Z: 50 mm/T: -10°～ +70°, R: 360° •SEM Detectors and Extensions Standard：Inlens Electron Detector/Everhart-Thornley Detector (ETD) Optional：Retractable Backscattered Electron Detector (BSED) Retractable Scanning Transmission Electron Microscope(STEM) Low Vacuum Detector（LVD） Energy Dispersive Spectroscopy (EDS / EDX) Electron Backscatter Diffraction Pattern (EBSD) Specimen Exchange Loadlock （4 inch /8 inch) Trackball & Knob Control Panel •Software Language：English Operating System：Windows Navigation：Optical Navigation, Gesture Quick Navigation, Trackball (optional) Automatic Functions：Auto Brightness & Contrast, Auto Focus, Auto Stigmator The CIQTEK SEM5000Pro is a Schottky field emission scanning electron microscope (FE-SEM) specialized at high resolution even under low excitation voltage. Employing an advanced "Super-Tunnel" electron optics technology facilitates a crossover-free beam path together with an electrostatic-electromagnetic compound lens design. These advancements reduce spatial charging effect, minimize lens aberrations, enhance imaging resolution at low voltage, and achieve a resolution of 1.2 nm at 1 kV.