Field emission scanning electron microscope SEM4000Pro

inspectionlaboratoryfor materials analysis

CIQTEK SEM4000Pro FESEM Microscope Specifications • Electron Optics - Resolution: High Vacuum 0.9 nm @ 30 kV, SE Low Vacuum 2.5 nm @ 30 kV, BSE, 30 Pa/1.5 nm @ 30 kV, SE, 30 Pa Acceleration Voltage: 0.2 kV ~ 30 kV Magnification (Polaroid): 1 ~ 1,000,000 x Electron Gun Type: Schottky Field Emission Electron Gun • Specimen Chamber Low Vacuum: Max 180 Pa Camera: Dual Cameras (Optical navigation + chamber monitoring) XY Range:110 mm Z Range:65 mm T Range:-10° ~ +70° R Range:360° • SEM Detectors and Extensions - Standard: Everhart-Thornley Detector (ETD) Low Vacuum Detector (LVD) Backscattered Electron Detector (BSED) Optional: Retractable Scanning Transmission Electron Microscopy Detector (STEM) Energy Dispersive Spectrometer (EDS / EDX) Electron Backscatter Diffraction Pattern (EBSD) Specimen Exchange Loadlock (4 inch / 8 inch） Trackball & Knob Control Panel • User Interface Navigation: Optical navigation, Gesture quick navigation, Trackball (optional) Automatic Functions: Auto Brightness & Contrast, Auto Focus, Auto Stigmator CIQTEK SEM4000Pro is an analytical FE-SEM model equipped with a high-brightness and long-life Schottky field emission electron gun. Its three-stage electromagnetic lens design offers significant advantages in analytical applications such as EDS / EDX, EBSD, WDS, and more. The model comes standard with a low-vacuum mode and high-performance low-vacuum secondary electron detector, as well as a retractable backscattered electron detector, which benefits the observation of poorly conductive or non-conductive specimens.