Field emission scanning electron microscope SEM4000Pro

laboratorySchottky field emissionsecondary electron

CIQTEK SEM4000Pro is an analytical field emission scanning electron microscope equipped with a high-brightness long-life Schottky field emission electron gun. With the three-stage condenser electron optics column design for beam currents up to 200 nA, SEM4000Pro delivers advantages in EDS, EBSD, WDS, and other analytical applications. The system supports low vacuum mode as well as a high-performance low-vacuum secondary electron detector and retractable backscattered electron detector, which can help directly observe poorly conductive or even non-conductive samples. • Equipped with high brightness and long-life Schottky field emission electron gun • High resolution of 0.9nm at 30 kV • Three-stage condenser lens design, wide beam current adjustable range with max beam currents up to 200 nA • Standard low vacuum mode, high-performance low vacuum secondary electron detector, and retractable backscattered electron detector • Non-immersion magnetic field free objective lens design, can directly observe magnetic specimens • Standard optical navigation mode