Scanning electron microscope SEM3200

laboratoryfor quality controlfor materials analysis

CIQTEK SEM3200 SEM Microscope •Electron Optics： Resolution：3 nm@ 30 kV, SE/7 nm @ 3 kV, SE/4 nm @ 30 kV, BSE/3 nm @ 30 kV, SE, 30 Pa Accelerating Voltage：0.2 kV ~ 30 kV Magnification (Polaroid)：1 x ~ 300,000 x •Specimen Chamber Low Vacuum：5 ~ 1000 Pa (Optional) Camera： Optical Navigation/Chamber Monitoring Stage Type：5-Axis Vacuum Compatible Motorized XY Range：125 mm Z Range：50 mm T Range：- 10° ~ 90° R Range：360° •SEM Detectors Standard： Everhart-Thornley Detector (ETD) Optional： Retractable Back-Scattered Electron Detector (BSED) Energy Dispersive Spectrometer (EDS / EDX) Electron Backscattered Diffraction Pattern (EBSD) •Optional Specimen Exchange Loadlock Trackball & Knob Control Panel •User Interface Operating System： Windows Navigation： Optical Navigation, Gesture Quick Navigation, Trackball (Optional) Automatic Functions： Auto Brightness & Contrast, Auto Focus, Automatic Stigmator The CIQTEK SEM3200 SEM Microscope is an excellent general-purpose Tungsten Filament Scanning Electron Microscope (SEM) with outstanding overall capabilities. Its unique Dual-anode electron gun structure ensures high resolution and improves image signal-to-noise ratio at low excitation voltages. Furthermore, it offers a wide range of optional accessories, making the SEM3200 a versatile analytical instrument with excellent expendabilities. #Outstanding Performance Under Low Voltage #Dual-anode Electron Gun Dual-anode Electron Gun #Low Vacuum Mode Low Vacuum Mode #Pre-aligned Tungsten Filament Pre-aligned Tungsten Filament #Excellent Expandability Excellent Expandability