Focused ion beam scanning electron microscope DB500

for analysisfor researchinspection

CIQTEK DB500 is a Field Emission Scanning Electron Microscope with a Focused Ion Beam column for nano analysis and specimen preparation, which is applied with “SuperTunnel” technology, low aberration, and magnetic-free objective lens design, with low-voltage and high-resolution ability that ensures its nano-scale analytical capability. The ion column facilitates a Ga+ liquid metal ion source with a highly stable and high-quality ion beam to ensure nano-fabrication capability. DB500 is equipped with an integrated nano-manipulator, gas injection system, electrical anti-contamination mechanism for the objective lens, and 24 expansion ports, making it an all-around nano-analysis and fabrication platform with comprehensive configurations and expandability.