Field emission scanning electron microscope SEM4000X

inspectionlaboratoryfor materials analysis

CIQTEK SEM4000X FESEM Microscope Specifications Electron Optics - Resolution: 0.9 nm@ 30 kV, SE 1.2 nm@15 kV, SE 1.9 nm@1 kV, SE 1.5 nm@1 kV (Ultra beam deceleration) 1 nm@15 kV (Ultra beam deceleration) Acceleration Voltage: 0.2 kV ~ 30 kV Magnification (Polaroid): 1 ~ 1,000,000 x Electron Gun Type: Schottky Field Emission Electron Gun Specimen Chamber - Camera: Dual Cameras (Optical navigation + chamber monitoring) Stage Range: X: 110 mm Y: 110 mm Z: 50 mm T: -10°~ +70° R: 360° SEM Detectors and Extensions - Standard: In-lens Electron Detector: UD-BSE/UD-SE Everhart-Thornley Detector: LD Optional: Backscattered Electron Detector (BSED) Retractable Scanning Transmission Electron Microscopy Detector (STEM) Low Vacuum Detector (LVD) Energy Dispersive Spectrometer (EDS / EDX) Electron Backscatter Diffraction Pattern (EBSD) Specimen Exchange Loadlock (4 inch /8 inch) Trackball & Knob Control Panel Ultra Beam Deceleration Mode Technology The CIQTEK SEM4000X is a stable, versatile, flexible, and efficient FE-SEM. It easily tackles high-resolution imaging challenges for various types of samples. It can be upgraded with an ultra-beam deceleration mode to enhance low-voltage resolution even further. # High Resolution # Multi-detector Technology # Simplified Alignment # Built from a Higher-end Platform # *Ultra Beam Deceleration Mode Technology # Excellent Expandability