Tungsten filament microscope SEM 3300

scanning electronfor analysisfor materials analysis

CIQTEK SEM3300 SEM Microscope Specifications *Electron Optics Resolution: 2.5 nm @ 15 kV, SE 4 nm @ 3 kV, SE 5 nm @ 1 kV, SE Accelerating Voltage: 0.1 kV ~ 30 kV Magnification (Polaroid): 1 x ~ 300,000 x *Specimen Chamber Camera: Optical Navigation Chamber Monitoring Stage Type: 5-Axis Vacuum Compatible Motorized XY Range: 125 mm Z Range: 50 mm T Range: - 10° ~ 90° R Range: 360° *SEM Detectors Standard: In-lens Electron Detector (Inlens) Everhart-Thornley Detector (ETD) Optional: Retractable Back-Scattered Electron Detector (BSED) Energy Dispersive Spectrometer (EDS / EDX) Electron Backscattered Diffraction Pattern (EBSD) *Optional Specimen Exchange Loadlock Trackball & Knob Control Panel *User Interface Operating System: Windows Navigation: Optical Navigation, Gesture Quick Navigation, Trackball (Optional) Automatic Functions: Auto Brightness & Contrast, Auto Focus, Automatic Stigmator The CIQTEK SEM3300 Scanning Electron Microscope (SEM) incorporates technologies such as "Super-Tunnel" electron optics, inlens electron detectors, and electrostatic & electromagnetic compound objective lens. By applying these technologies to the tungsten filament microscope, the long-standing resolution limit of such SEM is surpassed, enabling the tungsten filament SEM to perform low-voltage analysis tasks previously only achievable with field emission SEMs. *Break Through the Resolution Limit of Tungsten Filament SEMs *In-lens Electron Detector *Electromagnetic & Electrostatic Combo Objective Lens *Safer to Use *Excellent Expandability