Scanning electron microscope SEM2100

laboratoryfor materials analysisfor semiconductors

CIQTEK SEM2100 SEM Microscope Specifications Electron Optics Resolution: 3.9 nm @ 20 kV, SE 4.5 nm @ 20 kV, BSE Accelerating Voltage: 0.5 kV ~ 30 kV Magnification (Polaroid): 1 x ~ 300,000 x Specimen Chamber Camera: Optical Navigation Chamber Monitoring Stage Type: 3-Axis, XYZ Axis Vacuum Compatible Motorized XY Range: 125 mm Z Range: 50 mm SEM Detectors Standard: Everhart-Thornley Detector (ETD) Optional: Retractable Back-Scattered Electron Detector (BSED) Energy Dispersive Spectrometer (EDS / EDX) Electron Backscattered Diffraction Pattern (EBSD) Optional - Specimen Exchange Loadlock Trackball & Knob Control Panel User Interface - Operating System: Windows Navigation: Optical Navigation, Gesture Quick Navigation, Trackball (Optional) Automatic Functions: Auto Brightness & Contrast, Auto Focus, Automatic Stigmator The CIQTEK SEM2100 SEM Microscope features a simplified operating process and adheres to industry standards and user habits in its "User Interface" design. Despite the minimalist software interface, it provides comprehensive automated functions, measurement and annotation tools, image post-processing management capabilities, optical image navigation, and more. The design of SEM2100 perfectly realizes the idea of "Simplicity without sacrificing functionality". #Intuitive, Clean, Easy-to-use Ul design #Comprehensive Automation Functions #Integrated Image post-processing Functions #Integrated Image post-processing Functions #Standard Optical Image Navigation #Excellent Expandability #Safer to Use