SEM microscope CEM3000A

biomedicalfor researchfor materials research

Benchtop Scanning Electron Microscope CEM3000A is a precision instrument designed for microscale morphology observation and analysis of material surfaces. Equipped with a secondary electron probe and a backscattered electron probe, it supports both high vacuum and low vacuum modes, enabling high-precision scanning to capture clear morphological images with deep field of view, high resolution, and high contrast for various types of material surfaces. When used in conjunction with an energy dispersive spectrometer, it can also obtain information on the elemental composition of materials.

Overview

Benchtop Scanning Electron Microscope CEM3000A designed for microscale morphology observation and material surface analysis. Supports high-contrast, large depth-of-field imaging using secondary (SE) and backscattered (BSE) electrons and can be paired with an optional energy dispersive spectrometer (EDS) for elemental analysis.

Applications

Suitable for materials science, life sciences, nanotechnology and energy research; expandable via optional probes and accessories. Integrated anti-vibration and anti-magnetic features reduce noise and improve imaging stability.

Technical specifications

Product model: CEM3000A
Product name: Scanning Electron Microscope
Magnification (electron image): 40×–300,000× (large area stitching optional)
Maximum sample size (W × L × H): 70 mm × 70 mm × 45 mm
Filament / Electron gun: Tungsten filament
Resolution: ≤ 4 nm (SE), ≤ 8 nm (BSE) 20 kV
Accelerating voltage: 1 kV–20 kV
Detectors: Secondary Electron (SE) — standard; Backscattered Electron (BSE) — standard (4‑quadrant high-resolution probe)
Energy Dispersive Spectrometer (EDS): Bruker or Oxford (optional)
Vacuum system — High vacuum: better than 9×10⁻³ Pa
Vacuum system — Low vacuum (optional): 5–100 Pa
Vacuum pumping / throughput times: Low vacuum mode pump time ≤ 180 s; alternate low vacuum pump time ≤ 120 s
Sample changeover time: Vacuum discharge ≤ 30 s; vacuum re‑pumping ≤ 100 s
Stage axes: Motorized: X, Y, T; Manual: R, Z
Stage travel range: X: 50 mm; Y: 50 mm; Z: 45 mm
Rotation and tilt: R: 0–360 (manual rotation, electron-beam rotation); T: -22.5–22.5
In-chamber cameras: Navigation camera (Top-View) — standard high-resolution color; Side-View camera — standard high-resolution IR
Operating system: Windows 10 / 11 (64 bit)
Supported image sizes: 640×480, 1280×960, 2560×1920, 5120×3840, 10240×7680
Weight: 120 kg
Dimensions (W × L × H): 400 × 670 × 730 mm
Input power: 200–240 VAC, 50/60 Hz, 800 W
Operating environment: Working temperature 15C–30C (fluctuation ≤ 1C / 15 min); relative humidity ≤ 65%, no condensation

Automation and software

Integrated automation features: auto alignment, auto focus, auto stigmation and one-click image enhancement to streamline routine imaging and analysis.

Options and accessories

Optional EDS (Bruker or Oxford), low-vacuum mode, large-area stitching, additional probes and customized accessories available to adapt the system to specific laboratory needs.