Mechanical profiler NS200-D

direct-contactroughnessfor production lines

Stylus Nano Profiler NS200 is an ultra-precision contact measuring instrument for measurement of surface roughness and microscopic profile, such as micro-nano step height, film thickness.The NS200 uses a displacement sensor with sub-angstrom resolution, ultra-low noise signal acquisition, ultra-fine motion control, and calibration algorithms technology with excellent performance. Its contact force is extremely small, and there are no special requirements for measuring surface reflection characteristics, material types, and material hardness, consequently, it is widely used to measure microscopic surface for industries of semiconductors and compound semiconductors, high-brightness LEDs, solar energy, MEMS micro-electromechanical systems, touch screens, automotive and medical equipment. Application semicodnuctor-large-substrate-Glass-substrate-and-display-film-on-flexible-component Semiconductor ● Step height of deposited film ● Step height of thin Film Resist ● Etch rate measurement ●Chemico-mechanical polishing (corrosion, pitting, bending) Large Substrate ● PCB protrusion, step height ● Window coating ● Wafer mask ● Wafer chuck coating ● polishing plate Glass substrate and display ● AMOLED ● Step height measurement during LCD screen development ● Thickness measurement for touch panel film Solar Coating Thin Film Measurements Film on flexible component ● Organic photodetector ● Organic films printed on film and glass Touch screen copper traces