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Resolution: 7, 3, 8, 20 nm
Weight: 10 kg
... sample loading up to twice as fast as average systems. All of which makes the Axia ChemiSEM System an ideal choice for materials science applications like product failure investigation and contaminant identification where every aspect ...
Resolution: 1.2, 0.6, 1, 0.7 nm
... scanning electron microscope for TEM sample preparation including 3D characterization, cross-sectioning and micromachining. The Thermo Scientific Helios 5 Plasma FIB (PFIB) DualBeam (focused ion beam scanning electron microscope, ...
... to the microscope’s ergonomic design. Meet Visoria M For routine material inspection With the Visoria M materials microscope, you can examine the microstructure of metals, alloys, ...
... Investigate, develop and analyze materials, especially metallographic specimens, in no time at all with ZEISS Axio Observer. Take advantage of its inverted design. Axio Observer combines the quality of ZEISS optics with automated components. ...
ZEISS Métrologie et Microscopie Industrielle
... comprehensive range of available options, EVO can be tailored precisely to your requirements, whether you are in life sciences, material sciences, or routine industrial quality assurance and failure analysis. Versatile solution ...
ZEISS Métrologie et Microscopie Industrielle
... 3D resolution in your FIB-SEM analysis Maximize Your SEM Insights Extract true sample information from your high resolution SEM images using Gemini electron optics. Count on the SEM performance ...
ZEISS Métrologie et Microscopie Industrielle
Magnification: 5 unit - 800,000 unit
Resolution: 15, 4, 3 nm
... overview: Colour navigation images of the sample plates cover the entire sample area observable by SEM - Carefree operation - collisions between the stage and SEM components are virtually eliminated by automatically ...
Magnification: 40 unit - 300,000 unit
Resolution: 4 nm - 8 nm
Weight: 120 kg
... Benchtop Scanning Electron Microscope CEM3000A is a precision instrument designed for microscale morphology observation and analysis of material surfaces. Equipped with a secondary electron probe and a backscattered electron ...
Magnification: 10 unit - 220 unit
Resolution: 650 nm
Weight: 137 g
With the use of the latest, cutting-edge optics, a brand new 5 megapixel sensor and several special features, the Dino-Lite AM7915MZT is a marvel of technology and the best choice for the high-demanding professional. The Dino-Lite AM7915MZT offers superb ...
Dino-Lite Europe/IDCP BV
Magnification: 20 unit - 220 unit
Resolution: 650 nm
Weight: 135 g
With the use of the latest, cutting-edge optics, a brand new 5 megapixel sensor and several special features such as Flexible LED Control (FLC) and full aluminum body, the Dino-Lite AM7115MZT is a marvel of technology and the best choice for the high-demanding ...
Dino-Lite Europe/IDCP BV
Magnification: 10 unit - 220 unit
Weight: 120 g
Length: 130 mm
... of handheld digital microscopy, the 8-megapixel AM8917MZT is a high-resolution digital microscope capable of revealing the minute details of the target. The microscope also delivers outstanding color fidelity, enhancing ...
Dino-Lite Europe/IDCP BV
... The new "Machine Vision Microscope" (MVM) is a purely digital microscope with all the features that make a microscope. It has an apochromatically highly corrected microscope objective ...
Magnification: 50 unit - 1,000 unit
... optional digital camera device (industrial camera)，Metallographic grading software，upgrade more other accessories to adapt more work condition to use. Applicable occasions: factory testing and inspection, laboratory research, teaching ...
Magnification: 300,000 unit
Resolution: 4, 7, 3 nm
Weight: 480 kg
... Brightness & Contrast, Auto Focus, Automatic Stigmator The CIQTEK SEM3200 SEM Microscope is an excellent general-purpose Tungsten Filament Scanning Electron Microscope (SEM) with outstanding overall ...
CIQTEK Co., Ltd.
... 1. Application HL401W metallographic microscope is a trinocular upright metallographic microscope, which can provide superior image quality and stable operating system, easy operation and complete accessories. Widely ...
Shanghai Hualong Test Instruments Corporation
Weight: 10.5, 12.3, 11.7, 10.3 kg
Length: 560 mm
Width: 235, 220 mm
... Your routine inverted microscope for materials science. Microstructural and Structural Analysis: A Question of Contrast. With Axio Vert.A1 you examine large, heavy samples, using a wide range of classic and advanced ...
Hitech Instruments
Resolution: 0.02 µm
... Product overview
The Atomic Force
Microscope (wafer-level AFM) is a high-resolution scanning probe instrument designed to characterize three-dimensional surface morphology and multifunctional properties of conductors, semiconductors ...
Magnification: 0.7 unit - 4 unit
Height: 60 cm
... Universal TIG binoculars for safe, accurate welding The TIG binocular can be adapted to all types and makes of welding unit, offering a universal solution for professionals and enthusiasts alike. Equipped with a darkening screen, it effectively protects ...
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