STEM microscope Helios Hydra
for quality controlfor materials research3D

STEM microscope - Helios Hydra - THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE - for quality control / for materials research / 3D
STEM microscope - Helios Hydra - THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE - for quality control / for materials research / 3D
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Characteristics

Type
STEM
Technical applications
for quality control, for materials research
Observation technique
3D
Ion source
xenon, plasma, argon
Other characteristics
high-resolution, observation
Resolution

1 µm, 2 µm, 4 µm, 5 µm, 20 µm

Description

The Thermo Scientific Helios Hydra PFIB-SEMs are versatile multi-application tools with four different ion species (argon, nitrogen, oxygen, and xenon), allowing you to choose the ions that provide the best results. Great results start with comprehensive sample preparation, whether you are performing S/TEM lamella imaging, 3D characterization, or large area physical failure analysis. Now with enhanced, targeted applications capability, the Helios 5+ Hydra is here. Learn more about what this innovative system can do for your failure analysis and materials characterization challenges. Instrument features of the Helios Hydra PFIB-SEM Multiple plasma FIB ion species You can switch easily between argon, nitrogen, oxygen, and xenon in under ten minutes without sacrificing performance. This remarkable flexibility significantly expands the potential application space of PFIB and helps enable research of ion–sample interactions to optimize existing use cases. Ultra-high-resolution SEM analysis Combines the innovative multi-ion species plasma-FIB column with the monochromated Thermo Scientific Elstar UC+ SEM Column to provide advanced focused ion- and electron-beam performance. Precision FIB milling control Provides precise control of your milling processes and experiments with optimized beam profiles, even at maximum currents, with timesaving, intuitive software for manual and guided workflow applications. Extreme plasma FIB milling Significant enhancements for large-volume applications can be achieved easily with automated alignments for all PFIB apertures, allowing 50% higher in max currents to always be accessible and optimized, up to 6µA.

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