FIB/SEM microscope Scios 3

for analysisfor quality controlfor research

Versatile FIB-SEM for high throughput performance with advanced automation The Thermo Scientific Scios 3 FIB-SEM is an advanced, ultra-high-resolution analytical-focused ion beam scanning electron microscope (FIB-SEM). It excels in delivering exceptional sample preparation and 3D characterization for a wide range of samples, including magnetic and non-conductive materials. Designed with innovative features to enhance throughput, reliability, and ease of use, the Scios 3 FIB-SEM is an ideal solution for scientists and engineers conducting advanced research and analysis in diverse environments. Combined with the full suite of automated software applications, Scios 3 FIB-SEM is tailored to facilitate most common use cases. This user-friendly and innovative solution significantly boosts productivity, making it valuable for users in both industry and academia. features Automated cross-section analysis The Scios 3 FIB-SEM offers an automated application for cross-section analysis, enabling high-quality subsurface characterization with precise targeting. It streamlines workflows, reduces user intervention, and ensures consistent, high-quality results in high-throughput environments. High-throughput analytical 3D characterization Thermo Scientific Auto Slice & View 5 Software for the Scios 3 FIB-SEM offers automated serial sectioning for high-throughput 3D analysis. Seamless integration enables multi-modal data collection, including SEM imaging, compositional, microstructural, and crystallographic information. Automated, high-quality, site-specific (S)TEM sample preparation The Scios 3 FIB-SEM enables fast and easy preparation of high-quality, site-specific (S)TEM samples.