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3D microscopes
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focused ion beam scanning electron microscopeHelios 5 DualBeam
Resolution: 0.3 nm - 1.5 nm
... high-quality sample preparation for (S)TEM imaging and atom probe tomography (APT) as well as the high-quality subsurface and 3D characterization. Building on the proven capabilities of the Helios DualBeam ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE

Resolution: 1,030, 515 nm
... applications such as transmission electron microscopy (TEM) sample preparation, atom probe tomography (APT) sample preparation, and 3D structural analysis.
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE

Resolution: 1.2, 0.6, 1, 0.7 nm
... are performing scanning transmission electron microscopy (STEM) and transmission electron microscopy (TEM) sample preparation, 3D materials characterization, or cellular cryo-tomography. You can switch ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE

Magnification: 54 unit - 17,280 unit
Weight: 31, 32, 50, 43 kg
Laser Microscope for Material Analysis Smart Workflow, Faster Experiments Built for failure analysis and material engineering research, the OLS5100 laser microscope combines exceptional measurement ...

... on the latest LED technology and is fully integrated into the microscope. The low heat radiation and integration into the stand ensures that there is an optimal airflow around the microscope. The long ...
Leica Microsystems GmbH

... hand. High-resolution 10 megapixel camera with fast live image display (30 images per second). Intelligent software for 2D- and 3D measurements, reproducible results and creation of reports ...
Leica Microsystems GmbH

... to optimize material performance. Does your surface have steep slopes or complex shapes? Achieve vertical resolution up to 2 nm withHD confocal microscopy. Is your surface smooth with micro peaks and valleys? Choose ...
Leica Microsystems GmbH

Resolution: 0.5, 2 µm
... Advanced particle analysis to quickly identify and analyze tiny contaminants in your sample 3D confocal imaging provides non-destructive, non-invasive 3D investigation ...

... deviations on critical geometric dimension ZEN core’s unified user interface allows users to operate microscopes the same way, from stereo microscopes to fully automated high-end applications. The powerful ...
ZEISS Industrial Metrology

The integrated widefield confocal microscope ZEISS Smartproof 5 is your system for surface analysis in quality assurance and quality control. Put it to work on a wide range of industrial applications - such as roughness ...
ZEISS Industrial Metrology

... diverse lab environments. Highlights Industry-leading 4D and In Situ Capabilities for Flexible Sample Sizes and Types Xradia 410 Versa X-ray microscope delivers cost-efficient, flexible 3D ...
ZEISS Industrial Metrology

... the beam shape to suit the highly specific requirements of your sample. You choose what gives you the best results for your 3D high resolution imaging experiment – large field of view, high speed or ...

Magnification: 49 unit - 353 unit
... digital microscope, incorporating Zeiss Visioner1 and MALS™ technology, offers greater depth of field (DOF) than any conventional microscope system, providing real-time clear images in a single view. All ...

Magnification: 2,000 unit
Resolution: 0.5, 0.1, 1 µm
The MF measuring microscope has a measuring accuracy that is highest in its class, and it follows the standards of JIS B 7153. It has a good expandability that makes it more reliable when associated with Mitutoyo's vision ...

Resolution: 1.2 nm
... on-demand image optimization on the fly. • A visual and interactive guide offers 'pick and choose' SEM modes to ensure best operating conditions. • With the 3D MultiFinder tool, samples ...
Hitachi High-Tech Europe GmbH

Magnification: 1,000,000, 800,000, 600,000 unit
Resolution: 0.2, 0.14, 0.19 nm
... Advanced stage-navigation function enables whole-grid searching and efficient image acquisition. • Automated image stitching, 3D tomography, STEM, EDX, in-situ, and other options available for a broad ...
Hitachi High-Tech Europe GmbH

Magnification: 20 unit - 2,000,000 unit
Resolution: 0.7, 0.6 nm
... steps to be clearly visible (image on right). A Smart Detection System for Low Voltage BSE Imaging Cross section image of 3D NAND; Oxide layer and Nitride layer of capacitor are easily distinguishable ...
Hitachi High-Tech Europe GmbH

Magnification: 800 unit
Resolution: 50 nm
... resolution down to 50 nm with ZEISS Xradia 810 Ultra X-ray microscope, the highest among lab-based X-ray imaging systems. Experience unparalleled performance and flexibility with the non-destructive 3D ...
ZEISS Métrologie industrielle

Magnification: 18 unit - 93 unit
This mechanical 3D-microscope has a large working distance of 175 mm. Thus the analysis of even larger objects is very simplified. The 3D-microscope provides a three-dimensional ...

Magnification: 7 unit - 150 unit
... The 3D digital microscope is a digital microscope with its own user interface, in which a variety of analysis functions are available. The live image and the user ...

... both cases. In the entry-level class, the M3 measurement software sets standards in intuitive operation and functionality. Should you have further demands on the programming and analysis possibilities, then our 3D ...

Resolution: 14 µm - 110 µm
Extend the resolution of your optical microscope The Nanosurf LensAFM is an atomic force microscope that continues where optical microscopes and profilometers reach their resolution ...

The Invizo® 6000 3D Atom Probe microscope introduces major technology breakthroughs to push the boundaries of atom probe analysis. Its ultra wide field of view flight path and unique dual-beam deep UV ...
CAMECA

The first 3D Atom Probe with combined voltage & laser pulsed operation The LEAP® 6000 XR inherits key features from previous APT generations, adding deep UV laser pulsing to the proven local electrode design to deliver ...
CAMECA

... enables routine, high performance 3D nano-analysis for both research and industry Building on 30 years of success in Atom Probe Tomography instrumentation and application, CAMECA has developed EIKOS-UV™, the Atom Probe ...
CAMECA

Weight: 1.4 kg
... class. The SteREO Discovery V8 impresses with enhanced resolution, increased contrast and, most notably, a perceptibly improved 3D stereoscopic impression. As a result, it offers an image brilliance ...

Resolution: 1 µm
Weight: 22, 30 kg
... automated 3D digital microscope that couldn't be easier to use - ideal for efficient workflow and quick results in virtually every field of industry. Smart Design. Smart Workflow. Smart Output. ...

ZTX-S series zoom microscope adopts optical imaging system,with high resolution,fine definition and strong sense of three-dimensional,easy operation.The microscope is Widely used in semiconductor and ...

Weight: 150 kg
Length: 520 mm
Width: 1,160 mm
... industry-grade sealed X-ray source is maintenance-free. SKYSCAN 1272 is complemented by 3D.SUITE. This comprehensive software suite covers GPU-accelerated reconstruction, 2D/ 3D ...
Bruker Nano Surfaces

... constituent elements for an image observation area, and "Live 3D" for displaying a reconstructed live 3D image during SEM observation. When you place ...

3D Scanning Laser Spectrometer RAMOS CARS Multifunctional - RAMOS CARS combines: • CARS scanning microscope • Raman / luminescent scanning confocal microscope • Conventional scanning ...
Ostec

Increased hold time to >65h at same performance level High frequency wiring Increased spectroscopy resolution Record proven platform since 1996 with more than 200 devices installed Reliable design ensuring high up-time Independent ...

... processing .This video toolmaker Microscope is mainly applied in 2D measurement, sometime in 3D as well . With eyepiece gauge , This video toolmaker Microscope ...

Magnification: 3 unit - 68 unit
Weight: 1.5 kg
Length: 216 mm
... quick go/no-go defect analysis. Z Height Measurement App Measure in 3D on the new Omni 3. Now you can measure in the Z axis, in addition to the X and Y axes, bringing the Omni 3 ...

Resolution: 0.26, 0.13 nm
Angstrom's AA5000 scanning probe microscope provides images of an atomic scale going up to 100 micrometer. It has STM, AFM, LFM conductive AFM, MFM, EFM, environmental control SPM and nano-processing techniques. With ...

... Scanning (CLS) Microscopy Systems consist of compact imaging modules specifically designed for infinity-corrected compound microscopes. They provide the ability to acquire high-resolution optical sections from within ...

... Measuring Microscope “ The only one in the world “ Includes ONESHOT VISIONBOX Measuring Microscope X, Y-axis Travel(mm): 200 x 100, Z-axis Travel(mm): 200 Linear Scale Resolution (mm): ...
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