SELL YOUR PRODUCTS
{{>currencyLabel}}
{{>currenciesTemplate}}
English
Français
Español
Italiano
Deutsch
中文
日本語
Português
Русский
Products
Search among 446,018 industrial products
Search amongst our 234,052 catalogs
Search amongst 755 projects
Search amongst 66,434 News & Trends
{{>productsMenu}}
Products
Catalogs
{{>projectsMenu}}
Projects
{{>trendsMenu}}
News & Trends
E-MAGAZINE
Products
>
Scienta Omicron
Website:
Scienta Omicron
Group:
Oxford Instruments
Products
Products
Catalogs
News & Trends
Exhibitions
All Scienta Omicron products
Scanning Probe Microscopy
laboratory microscope
TESLA JT SPM
scanning probe
benchtop
in-situ
laboratory microscope
Fermi DryCool SPM
scanning probe
benchtop
variable temperature
laboratory microscope
LT STM
scanning tunneling
3D
variable temperature
laboratory microscope
VT SPM
scanning probe
benchtop
in-situ
Electron Spectroscopy
X-ray photoelectron spectrometer
laboratory
R&D
MCP
photoelectron spectrometer
NanoSAM Lab
process
MCP
Auger
spectrum analyzer
DA20
for integration
compact
2D
liquid analyzer
HIPP-2 / HIPP-3
spectrum
for integration
photoelectron spectrometer
EW4000
process
high-resolution
laboratory microscope
FOCUS PEEM
electron
modular
real-time
X-ray source with integrated power supply
DAR 400
lamp light source
VUV5k
VUV
compact
for spectroscopy
scanning electron microscope electron beam source
SEM 250 / SEM 500
ion source
FDG15
FIB focused ion beam probe
GCIB 10S
Molecular Beam Epitaxy
electron beam evaporator
EFM 3
laboratory
electron beam evaporator
EFM 6
process
electron beam evaporator
Triple EFM
process
electron beam evaporator
EFM-H
process
low-temperature effusion cell
NTEZ
high-temperature effusion cell
WEZ
effusion cell
PEZ
CVD plasma source
PVD
for surface treatment
valved arsenic cracker
Tailored Systems
scanning probe microscope (SPM) ultra-high-vacuum (UHV) system
MULTIPROBE S
scanning probe microscope (SPM) ultra-high-vacuum (UHV) system
MULTIPROBE P,XP,XA,RM
scanning probe microscope (SPM) ultra-high-vacuum (UHV) system
MULTIPROBE MXPS
MBE system
ARPES
MBE system
UHV PLD
Electron Diffraction
X-ray source
BDL600IR-MCP
Other products
scanning electron microscope electron beam source
SEM 20
Laboratory microscope
Liquid analyzer
Compact analyzer
Process spectrometer
Lamp light source
Laboratory evaporator
Ergonomic microscope
Real-time microscope
Near field probe microscope
MBE system
X-ray source with integrated power supply
Surface treatment plasma source
MCP spectrometer
Electron beam source
Focused ion beam probe
Microscope
Integration analyzer
Spectrometer
Laboratory spectrometer
Spectrum analyzer
see more
Benchtop microscope
Process evaporator
Ultraviolet light source
High-resolution spectrometer
Compact light source
3D microscope
Electron microscope
Modular microscope
R&D spectrometer
X-ray source
Spectroscopy light source
Scanning probe microscope
Variable temperature microscope
Ion source
In-situ microscope
Photoelectron spectrometer
Plasma source
2D analyzer
Low-temperature microscope
Scanning tunneling microscope
FIB focused ion beam probe
Compare
Remove all
Compare up to 10 products