Exhibit with us
{{>currencyLabel}}
Back
{{>currenciesTemplate}}
English
Back
Français
Español
Italiano
Deutsch
中文
日本語
português
Русский
Your most recent searches
Delete
Frequent searches
Suggestions
Other sections
Search {0} in Catalogues
Search {0} in Projects
Search {0} in News & Trends
Brands containing {0}
{{>productsMenu}}
Products
Catalogs
RFQ
{{>trendsMenu}}
News & Trends
E-MAGAZINE
Products
>
Scienta Omicron
Products
Products
Catalogs
News & Trends
Exhibitions
All Scienta Omicron products
Scanning Probe Microscopy
scanning probe microscope
TESLA JT SPM
laboratory
in-situ
benchtop
scanning probe microscope
Fermi DryCool SPM
laboratory
benchtop
variable temperature
scanning tunneling microscope
LT STM
laboratory
3D
variable temperature
scanning probe microscope
VT SPM
laboratory
in-situ
benchtop
Electron Spectroscopy
X-ray photoelectron spectrometer
laboratory
R&D
MCP
photoelectron spectrometer
NanoSAM Lab
process
MCP
Auger
spectrum analyzer
DA20
for integration
compact
2D
liquids analyzer
HIPP-2 / HIPP-3
spectrum
for integration
photoelectron spectrometer
EW4000
process
high-resolution
electron microscope
FOCUS PEEM
laboratory
modular
real-time
X-ray source with integrated power supply
DAR 400
lamp light source
VUV5k
VUV
compact
for spectroscopy
scanning electron microscope electron beam source
SEM 250 / SEM 500
ion source
FDG15
focused ion beam probe
GCIB 10S
Molecular Beam Epitaxy
electron beam evaporator
EFM 3
laboratory
electron beam evaporator
EFM 6
process
electron beam evaporator
Triple EFM
process
electron beam evaporator
EFM-H
process
low-temperature effusion cell
NTEZ
high-temperature effusion cell
WEZ
effusion cell
PEZ
CVD plasma source
PVD
for surface treatment
valved arsenic cracker
Tailored Systems
scanning probe microscope (SPM) ultra-high-vacuum (UHV) system
MULTIPROBE S
scanning probe microscope (SPM) ultra-high-vacuum (UHV) system
MULTIPROBE P,XP,XA,RM
scanning probe microscope (SPM) ultra-high-vacuum (UHV) system
MULTIPROBE MXPS
MBE system
ARPES
MBE system
UHV PLD
Electron Diffraction
X-ray source
BDL600IR-MCP
Other products
scanning electron microscope electron beam source
SEM 20
Liquids analyzer
Microscope
Spectrometer
Integration analyzer
Laboratory microscope
Compact analyzer
Laboratory spectrometer
Benchtop microscope
Spectrum analyzer
Process spectrometer
Process evaporator
High-resolution spectrometer
Lamp light source
Laboratory evaporator
Compact light source
Ultraviolet light source
Ergonomic microscope
3D microscope
R&D spectrometer
Modular microscope
see more
Electron microscope
Real-time microscope
Near field probe microscope
X-ray source
In-situ microscope
Spectroscopy light source
Scanning probe microscope
Photoelectron spectrometer
X-ray source with integrated power supply
MBE system
Plasma source
Surface treatment plasma source
2D analyzer
Ultra-high-vacuum (UHV) system
Variable temperature microscope
MCP spectrometer
Scanning tunneling microscope
Low-temperature microscope
Compare
Remove all
Compare up to 10 products
