Scanning probe microscope VT SPM

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25 K 1500 K True pA STM Improved dI/dV Spectroscopy Beam Deflection AFM QPlus sensor AFM In-situ Evaporation The Omicron VT SPM is a well established microscope in many research labs for Scanning Probe Microscopy. It won the prominent R&D award in 1996. To date, more than 500 instruments have been delivered and successfully installed around the world. The volume of research results and publications is a conclusive proof for the performance, quality, and versatility of the Variable Temperature SPM design. The Variable Temperature SPM uses the latest preamplifier technology for true sub-pA scanning tunnelling microscopy and spectroscopy. Stable low current operation is important for the investigation of surfaces that are sensitive or have a low conductivity. For modulation spectroscopy an electronic compensation reduces the influence of parasitic currents. This saves acquisition time and improves results. The AFM Technology of the Variable Temperature SPM is based on more than 20 years of experience in Atomic Force Microscopy in UHV. It has been continuously developed and improved. The classic Beam Deflection AFM for contact and non-contact AFM offers the flexibility for many operational modes and different cantilever types. For example high resolution AFM, Friction Force Microscopy, Electrostatic Force Microscopy (EFM), Scanning Kelvin Probe Microscopy (SKPM) and Magnetic Force Microscopy (MFM) are available.