Variable temperature microscopes

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scanning electron microscope
scanning electron microscope
ZEISS EVO

In an industrial quality, failure analysis, or research environment, the scanning electron microscope (SEM) is the solution of choice for metallography and failure analysis applications, due to its ability to provide ...

polarizing microscope
polarizing microscope
ECLIPSE LV100N POL

Weight: 17 kg
Length: 490 mm
Width: 251 mm

The ECLIPSE LV100N POL and Ci-POL series of polarising microscopes is used to study the birefringent properties of anisotropic specimens by observing image contrast and colour changes. Nikon offers systems for both quantitative ...

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Nikon Metrology
optical microscope
optical microscope
Eclipse LV100ND

Weight: 9.5 kg
Length: 362 mm
Width: 251 mm

... Modular Motorised and Manual Upright Microscopes Superb Nikon CFI60-2 optics provide excellent images to both eyepieces and to Nikon’s digital imaging cameras with analysis software. The universal microscope ...

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Nikon Metrology
metallurgical microscope
metallurgical microscope
ECLIPSE MA200

Magnification: 1 unit - 100 unit
Length: 295 mm
Width: 215 mm

... Modular, Ergonomic, Inverted Metallurgical Microscope Superb Nikon CFI60-2 optics provide excellent images to both eyepieces and to Nikon’s digital imaging cameras with analysis software. The universal microscope ...

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Nikon Metrology
optical microscope
optical microscope
Eclipse Ci-POL

Magnification: 5 unit - 100 unit
Weight: 14 kg
Length: 271 mm

The ECLIPSE LV100N POL and Ci-POL series of polarising microscopes is used to study the birefringent properties of anisotropic specimens by observing image contrast and colour changes. Nikon offers systems for both quantitative ...

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Nikon Metrology
scanning probe microscope
scanning probe microscope
Fermi DryCool SPM

... mechanical and thermal noise to a typical level of state-of-the art low temperature SPM´s. The extremely low drift of the Fermi DryCoolTM SPM outperforms SPM´s with conventional cooling ...

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Scienta Omicron
scanning tunneling microscope
scanning tunneling microscope
LT STM

... installed Reliable design ensuring high up-time Independent tip and sample temperature Leading QPlus® AFM technology Since its introduction in 1996, our Low Temperature STM has set the standard ...

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Scienta Omicron
scanning probe microscope
scanning probe microscope
VT SPM

... results and publications is a conclusive proof for the performance, quality, and versatility of the Variable Temperature SPM design. The Variable Temperature SPM uses ...

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Scienta Omicron
AFM microscope
AFM microscope
CoreAFM

Resolution: 5 nm - 100,000 nm

The compact research AFM that offers best value for money The CoreAFM is the result of intelligently combining the core components of AFM to achieve maximum versatility and user-friendliness. Due to this fundamental design approach, ...

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