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Resolution: 1 µm
... Physical and Chemical imaging on a single platform Fully integrated system based on SmartSPM state of the art scanning probe microscope and LabRAM HR Evolution fully automated Raman micro-spectrometer. LabRAM HR Nano ...
Resolution: 0.13, 0.1, 0.26 nm
The OS-AA SPM system is known for its multifunctionality and openness. It is a platform for experiments that are unconventional and further development than a mere detecting facility. It is not merely a detecting facility. It also includes functions like ...
Angstrom Advanced
... > 5 days uninterrupted measurement time in varying magnetic fields with only 11 L LHe Temperatures down to 1 K with 4He Ultra low thermal drift Magnetic fields BZ > 3 T Optical access STM and QPlus® AFM Ergonomic ...
Scienta Omicron
... The Invizo® 6000 3D Atom Probe microscope introduces major technology breakthroughs to push the boundaries of atom probe analysis. Its ultra wide field of view flight path and unique ...
CAMECA
... CIQTEK Scanning Nitrogen-vacancy Microscope (SNVM) is an advanced scientific analytical instrument that combines optically detected magnetic resonance (ODMR) of diamond nitrogen-vacancy centers with the scanning probe ...
Resolution: 1 nm
... light is problematic. A typical application of the attoAFM III microscope is scanning gate microscopy (SGM) on semiconductor structures. This microscope is compatible with the commercially available tuning fork tips, ...
... The Nanosurf LensAFM is an atomic force microscope that picks up where optical microscopes and profilometers reach their resolution limits. It is mounted like a normal objective lens, thus extending the resolution and ...
Nanosurf
... The SAM Line offers easy-to-use scanning acoustic microscopes for process control and quality assurance as well as for research applications. The individual models are derived from a component platform that complies with industry standards ...
... The Automatic Atomic Force Microscope with Built-in Intelligence FX40 allows you to get the sharpest, clearest, highest resolution images one sample after another on multiple applications. It infuses artificial intelligence with robotics, ...
Park Systems
Resolution: 0.02 µm
... Product overview
The Atomic Force
Microscope (wafer-level AFM) is a high-resolution scanning
probe instrument designed to characterize three-dimensional surface morphology and multifunctional properties of conductors, ...
Resolution: 0.05, 0.2 nm
... and shape.Scan head and sample stage are designed together, strong anti-vibration performance Précision laser détection and probe alignment device make laser adjustment simple and easy.Adapt servomotor to drive the sample approaching ...
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