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Scanning probe microscope Scanning NV Microscope (SNVM)laboratorymedicalfor semiconductors
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Characteristics
- Type
- scanning probe
- Technical applications
- laboratory, medical, for semiconductors
- Ergonomics
- upright
- Microscope head
- binocular
- Quality of the objectives
- achromatic, apochromatic
- Observation technique
- bright field, fluorescence, confocal laser scanning, in-situ
- Configuration
- floor-standing
- Light source
- LED illumination, laser
- Ion source
- gallium, xenon
- Detector type
- in-lens SE
- Options and accessories
- computer-assisted
- Other characteristics
- digital camera, high-definition, for diamonds, high-precision
Description
The CIQTEK Scanning Nitrogen-vacancy Microscope (SNVM) is an advanced scientific analytical instrument that combines optically detected magnetic resonance (ODMR) of diamond nitrogen-vacancy centers with the scanning probe technique. This combination can be applied to the research of spintronics, multiferroic, 2D magnetic material, superconductors, etc.
* There are two versions: the ambient version and the cryogenic version.
Key Parameters -
SNVM (Room Temperature Version) - SNVM (Cryogenic Version)
Magnetic Sensitivity： - ≤ 2 μT/Hz1/2 - ≤ 5 μT/Hz1/2
Spatial Resolution： - 10 to 30 nm
Operating Temperature： - 300 K - 2K to 300 K
Featured Functions： - ISO-B Mode, Dual-B Mode, Full-B Mode, Quenching Mode, AFM Mode, MFM Mode, CFM Mode
Magnet Options - 0 to 50 mT - 9/1/1 T
Catalogs
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Weak Magnetic Measurement
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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.