Atomic force microscopes

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AFM microscope
AFM microscope
NanoRacer® AFM

Highest imaging speed with up to 50 frames per second NanoRacer® High-Speed AFM The NanoRacer® High-Speed AFM marks a quantum leap in quantitative imaging capabilities. The real-time visualization of ...

AFM microscope
AFM microscope
XploRA INV

The XploRA INV, manufactured by Horiba, is a Raman microscope which integrates exclusive automation features and small footprint. It has special sampling abilities of an inverted microscope. The unit ...

atomic force microscope
atomic force microscope
FX40 Automatic AFM

The Automatic Atomic Force Microscope with Built-in Intelligence FX40 allows you to get the sharpest, clearest, highest resolution images one sample after another on multiple applications. ...

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Park Systems
AFM microscope
AFM microscope
NX20

Park NX20 is an AFM platform for all Research Laboratories dealing with samples up to 200mm. From academic applications via Semiconductors and Failure Analysis, NX20 offers unique features such as accurate and reproducible ...

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Park Systems
atomic force microscope
atomic force microscope
NX-Wafer

Resolution: 0.5 µm

... the only wafer fab AFM with automatic defect review. It provides a fully automated AFM solution for defect imaging and analysis that improves defect review productivity by up to 1,000% Unique features: Low ...

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Park Systems
AFM microscope
AFM microscope
Alphacen 300

The tip-scanning AFM for heavy and large samples up to 300 mm •Standard AFM system • 300 mm x 300 mm sample stage • Ideal for samples up to 45 kg Nanosurf is the market leader for custom developed ...

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Nanosurf
atomic force microscope
atomic force microscope
Dimension Icon®

... Icon® brings the highest levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world’s most utilized large-sample AFM platform, ...

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Bruker Nano Surfaces
atomic force microscope
atomic force microscope
attoAFM III

Resolution: 1 nm

The attoAFM III is an atomic force microscope designed particularly for applications at low and ultra low temperature. Due to the non-optical shear force detection based ...

scanning probe microscope
scanning probe microscope
OS-AA

Resolution: 0.13, 0.1, 0.26 nm

The OS-AA SPM system is known for its multifunctionality and openness. It is a platform for experiments that are unconventional and further development than a mere detecting facility. It is not merely a detecting facility. It also includes ...

atomic force microscope
atomic force microscope
A62.45011

Resolution: 0.05, 0.2 nm

All-in-one design, smart structure and shape.Scan head and sample stage are designed together, strong anti-vibration performance Précision laser détection and probe alignment device make laser adjustment simple and easy.Adapt servomotor ...

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