Atomic force microscopes

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AFM microscope
AFM microscope
Nexus AFM

... starter system and a perfect addition to any thriving AFM lab. Best-in-Class performance Enables atomic- to molecular-resolution imaging. Ultimate versatility and value Delivers expansive range of AFM ...

AFM microscope
AFM microscope
XploRA INV

... The XploRA INV, manufactured by Horiba, is a Raman microscope which integrates exclusive automation features and small footprint. It has special sampling abilities of an inverted microscope. The unit can be used for various ...

atomic force microscope
atomic force microscope
attoAFM III

Resolution: 1 nm

... The attoAFM III is an atomic force microscope designed particularly for applications at low and ultra low temperature. Due to the non-optical shear force detection based on a tuning fork, ...

AFM microscope
AFM microscope
DriveAFM

... domains. With the DriveAFM, you can visualize the DNA double helix, observe the complex patterns of 2D materials and their atomic structure, and measure the electronic properties of semiconductors with high precision. The DriveAFM ...

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Nanosurf
atomic force microscope
atomic force microscope
FX40 Automatic AFM

... The Automatic Atomic Force Microscope with Built-in Intelligence FX40 allows you to get the sharpest, clearest, highest resolution images one sample after another on multiple applications. It infuses ...

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Park Systems
scanning probe microscope
scanning probe microscope
OS-AA

Resolution: 0.13, 0.1, 0.26 nm

The OS-AA SPM system is known for its multifunctionality and openness. It is a platform for experiments that are unconventional and further development than a mere detecting facility. It is not merely a detecting facility. It also includes functions like ...

atomic force microscope
atomic force microscope

Resolution: 0.02 µm

... Product overview
The Atomic Force Microscope (wafer-level AFM) is a high-resolution scanning probe instrument designed to characterize three-dimensional surface morphology and multifunctional ...

atomic force microscope
atomic force microscope
A62.45011

Resolution: 0.05, 0.2 nm

All-in-one design, smart structure and shape.Scan head and sample stage are designed together, strong anti-vibration performance Précision laser détection and probe alignment device make laser adjustment simple and easy.Adapt servomotor to drive the sample ...

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