In-situ microscopes

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X-ray microscope
X-ray microscope
SEM-Raman

SEM-Raman gives you comprehensive in situ sample characterisation in a single system. Redefine convenience, efficiency and productivity by combining these two technologies. Renishaw's structural and chemical analyser (SCA) interface ...

focused ion beam scanning electron microscope
focused ion beam scanning electron microscope
Helios 5

Resolution: 1,030, 515 nm

Focused ion beam milling and femtosecond laser ablation Thermo Scientific Helios 5 PFIB Laser Systems combine plasma focused ion beam milling with femtosecond laser ablation and SEM (scanning electron microscopy) imaging. This “TriBeam” ...

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THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
STEM microscope
STEM microscope
Talos L120C G2

Versatile TEM and STEM microscope for 2D and 3D visualization of beam sensitive samples and materials using high contrast. Talos L120C G2 Transmission Electron Microscope The Thermo Scientific Talos L120C G2 (S)TEM is a 20-120 kV ...

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THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
TEM microscope
TEM microscope
Themis ETEM

Atomic resolution TEM for materials analysis with an environmental mode for in situ TEM studies. In situ observation of structure dynamics at nanostructure-characteristic length scales is extremely important if your focus is atomic-scale ...

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THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
field emission scanning electron microscope
field emission scanning electron microscope
SU7000

Magnification: 20 unit - 2,000,000 unit
Resolution: 0.9, 0.8 nm

The modern FE-SEM requires not only high performance but also a multitude of functionalities including wide-area observation, in-situ analysis, variable pressure, high-resolution imaging at low accelerating voltages, and simultaneous ...

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Hitachi High-Tech Europe GmbH
field emission scanning electron microscope
field emission scanning electron microscope
SU5000

Resolution: 1.2 nm

Innovative analytical FE-SEM allows for a simple transition between high vacuum and variable pressure mode. EM Wizard is a knowledge-based system for SEM imaging that goes beyond basic preset conditions and recipes. Its ease of use opens ...

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Hitachi High-Tech Europe GmbH
STEM microscope
STEM microscope
HF5000

Magnification: 20 unit - 8,000,000 unit
Resolution: 0.08, 0.1 nm

Hitachi's unique 200 kV aberration-corrected TEM/STEM: the perfect harmony of imaging resolution and analytical performance 0.078 nm spatial resolution in STEM is achieved together with high specimen-tilt capability and large solid ...

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Hitachi High-Tech Europe GmbH
X-ray microscope
X-ray microscope
Xradia 410 Versa

ZEISS Xradia 410 Versa Your Workhorse Solution for 3D Submicron Imaging Bridge the Gap in Lab-Based Non-Destructive Submicron Microscopy Xradia 410 Versa bridges the gap between high-performing X-ray microscopes and less powerful ...

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ZEISS Industrial Metrology
digital microscope
digital microscope
IM•profile M

Resolution: 200 nm
Weight: 1 kg

The new Imaging Module profile with 20x 5MP is now also available with a uniquely compact X-Y-Z-Phi table to position the Life Science - Medical sample easily. It is an ultra compact inverse USB/GigE digital microscope with optimized ...

scanning electron microscope
scanning electron microscope
SEM3200

Magnification: 300,000 unit
Resolution: 3, 4, 8 nm
Weight: 480 kg

CIQTEK SEM3200 is a high-performance tungsten filament scanning electron microscope. It has excellent image quality, low vacuum mode compatibility, high resolution images in different fields of view. The depth of field is large and the ...

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CIQTEK Co., Ltd.
field emission scanning electron microscope
field emission scanning electron microscope
SEM5000

Magnification: 1 unit - 2,500,000 unit
Resolution: 1, 1.5, 0.8 nm
Weight: 950 kg

CIQTEK SEM5000 is a high-resolution, feature-rich field emission scanning electron microscope (FE-SEM, FEG SEM). Advanced column design, high voltage tunneling technology (SuperTunnel), low aberration non-leakage magnetic objective lens ...

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CIQTEK Co., Ltd.
scanning electron microscope
scanning electron microscope
SEM5000X

Magnification: 1 unit - 2,500,000 unit
Resolution: 0.6 nm
Weight: 400 kg

SEM5000X is an ultra-high resolution Field Emission Scanning Electron Microscope(FE-SEM) with breakthrough resolution of 0.6 nm@15 kV and 1.0 nm@1 kV. Benefited from upgraded column engineering process, “SuperTunnel” technology, and ...

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CIQTEK Co., Ltd.
polarizing microscope
polarizing microscope
ECLIPSE LV100N POL

Weight: 17 kg
Length: 490 mm
Width: 251 mm

The ECLIPSE LV100N POL and Ci-POL series of polarising microscopes is used to study the birefringent properties of anisotropic specimens by observing image contrast and colour changes. Nikon offers systems for both quantitative and qualitative ...

metallographic microscope
metallographic microscope
MOBISCOPE

Magnification: 100 unit - 500 unit
Length: 160 mm

In-situ/Field metallography is widely used for microstructure analysis on large parts (samples) that cannot be easily carried or where destructive preparation is not permissible such as storage tanks, piping system, power plants, etc. ...

scanning probe microscope
scanning probe microscope
TESLA JT SPM

> 5 days uninterrupted measurement time in varying magnetic fields with only 11 L LHe Temperatures down to 1 K with 4He Ultra low thermal drift Magnetic fields BZ > 3 T Optical access STM and QPlus® AFM Ergonomic design & expandable ...

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Scienta Omicron
Raman microscope
Raman microscope
RamMics M532/785

Resolution: 532, 785 nm

Precisely tailored to customer’s requirements Easy to use Fast and trustworthy results Cost-effective fully functional Raman system Low cost system Raman Microscope 532/785® is an optical spectral instrument with specialized ...

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