STEM microscope HF5000

for materials researchfor materials analysismetrology

The HF5000 is a Cs-corrected S/TEM customisable for in-situ experiments. The special feature is provided by the Everhart Thornley SE detector, which images the surface of the sample at 60-200kV, just like in an SEM. This is particularly advantageous for gas & heating in-situ experiments, in which gas reacts with the surface of the sample. Thanks to the Cs-corrector, the surface can be visualised with atomic resolution. The routine and fast switching between TEM and STEM makes daily work with a fully automated Cs corrector easy, even for beginners in the field of TEM. Product features: - Cold field emission electron source with energetically narrow band emission, ideal for high-resolution imaging and EELS - Hitachi STEM Cs corrector, fully automated - Secondary electron detector for superimposed information on sample surface in correlation to signal of transmitted electrons - ETEM experiments e.g. possible in an open gas atmosphere