Scanning electron microscope FlexSEM II

multipurposefor analysisfor non-metallic inclusion inspection

The super-compact VP-SEM with a choice of floor-standing or tabletop setup.

• Compact and flexible design
• High-resolution imaging
• Adaptable vacuum modes
• 5-axis sample stage
• Automated, user-friendly operation

Why choose the FlexSEM II

The FlexSEM II VP-SEM is designed for researchers and lab managers who need the capabilities of a traditional SEM in a more compact and easier-to-operate, tabletop-like package.

With high-resolution imaging and a range of adaptable features like embedded EDS analysis, it delivers powerful imaging performance, suitable for both seasoned professionals and newcomers to electron microscopy. The instrument’s flexible configuration makes it an ideal fit for various lab environments.

Whether you’re working with biological specimens, materials research, or multipurpose imaging, the FlexSEM II enables you to perform your analysis with high-quality images quickly and easily.

Features and benefits

Compact and flexible design

The FlexSEM II’s compact form (450 mm wide) allows it to fit comfortably in tight spaces while still delivering the performance expected from a full-sized SEM. Its modular design lets you place components wherever they’re most convenient, providing flexible installation options.

This flexibility means the system can easily be integrated into various settings, including small labs, offices, or even mobile setups. Running on a standard power outlet and only requiring an external roughing pump, it eliminates the need for specialized facilities, making high-quality imaging more accessible to a wider range of users.

Adaptable vacuum modes

The FlexSEM II incorporates a variable pressure imaging mode as standard, as well as high-vacuum, allowing observations under 100 Pa chamber pressure. This capability simplifies the imaging of non-conductive specimens by reducing the need for extensive sample prep – charge-up elimination is just a mouse-click away.

With these flexible vacuum options, you can easily handle a variety of specimen types, including sensitive or non-conductive materials, so you get more accurate and reliable imaging results.

High-resolution imaging

The electron optical system is driven by a user-exchangeable tungsten hairpin filament with extended lifetime due to dynamic saturation optimization. You get exceptional image quality and a SE resolution of up to 4 nm at 20kV accelerating voltage.

Besides a high-vacuum SE detector the FlexSEM II also features a sensitive 5-segment BSE detector, allowing for multiple image impressions in high and low vacuum modes.

An optional low-vacuum mode SE detector completes the detector ensemble. All this optimizes the FlexSEM for challenging imaging tasks both at higher and also surface-sensitive low accelerating voltages.

The high resolution and complete detector set enables users to capture intricate details of different samples - it’s suitable for everything from biological specimens to advanced materials research, all without compromising image clarity.