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Hitachi automated microscopes
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field emission scanning electron microscopeSU8700
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.6, 0.9, 0.8 nm
Weight: 25 kg
... acceleration voltage. EDX analysis and high-resolution imaging with all detectors are possible at 6mm working distance - Reliable automatic functions such as adaptation to user defined optical conditions or 2D autofocus and autostigmator ...
Hitachi High-Tech Europe GmbH
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.7, 0.6 nm
Weight: 25 kg
... specimen loading through standard six inch exchange chamber.
Overview
The SU8600 is a dedicated imaging
SEM offering ultra-high resolution thanks to Hitachi’s cold field emission (CFE) technology. Designed to meet ...
Hitachi High-Tech Europe GmbH
Magnification: 5 unit - 800,000 unit
Resolution: 0.9, 2.5, 1.6, 3, 15 nm
... user-friendly scanning electron
microscope platform with variable chamber pressure capabilities.What is the SU3800/3900 family?
The Hitachi SU3800/3900 family is a modular, user-friendly scanning electron
microscope ...
Hitachi High-Tech Europe GmbH
Magnification: 10 unit - 250,000 unit
Weight: 55, 53 kg
Length: 614, 617 mm
... TM4000PlusIII scanning electron microscope offers a compact, user-friendly solution for imaging and elemental analysis. Designed for a range of users - from research labs to industrial quality control - this new tabletop SEM ...
Hitachi High-Tech Europe GmbH
Magnification: 6 unit - 800,000 unit
Resolution: 15, 4 nm
Weight: 107 kg
... >5-axis sample stage
Why choose the FlexSEM II
The FlexSEM II VP-SEM is designed for researchers and lab managers who need the capabilities of a traditional SEM ...
Hitachi High-Tech Europe GmbH
... Cs-corrector, the surface can be visualised with atomic resolution. The routine and fast switching between TEM and STEM makes daily work with a fully automated Cs corrector easy, even for beginners in the field of TEM. Product ...
Hitachi High-Tech Europe GmbH
Magnification: 600,000, 800,000, 1,000,000 unit
Resolution: 0.2, 0.19, 0.14 nm
... Advanced
TEM imaging for research and industry
- Dual-Mode objective lens: Switch between high-contrast mode and high-resolution mode with a single click for unmatched flexibility.
- User-friendly interface: Modern,
Hitachi High-Tech Europe GmbH
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