Field emission scanning electron microscope SU8600

for analysis3Dcold field emission

The CFE-SEM for ultra-high spatial resolution, multi-perspective imaging

• Advanced automation for consistent, repeatable workflows.
• Display up to six imaging signals at the same time.
• Fast and easy specimen loading through standard six inch exchange chamber.

Overview

The SU8600 is a dedicated imaging SEM offering ultra-high resolution thanks to Hitachi’s cold field emission (CFE) technology. Designed to meet the needs of research scientists, lab managers, and industrial users alike, the SU8600 CFE-SEM delivers excellent spatial resolution and automation for modern labs.
1, 2, 4 or 6 signals can be displayed at the same time on a single monitor. By adding a second screen, the dual-monitor configuration boosts productivity and expands your workspace. Dual monitors also allow you to customise the operation panel with submenus positioned anywhere on either screen.

Features and benefits

Ultra-high resolution for unmatched imaging

The SU8600’s high-brightness cold-field emission source provides exceptional resolution, even at low voltages. This lets you capture intricate details with clarity, making it ideal for advanced material science, semiconductor studies, and biological analysis.

The narrow energy width (almost monochromatic) emission minimizes chromatic aberrations, so you can operate the SU8600 without beam boosting.

Multiple signals emitted from the observed specimen are collected by the magnetic lens field and guided into the in-column, multi-detector system. This system lets you display up to six imaging signals at the same time.