3D microscope VK-X4000

opticalfor analysismetrology

3 measurement principles in 1 system Automatically measure multiple areas across multiple parts AI-Analyzer easily determines key surface differences for you The VK-X4000 Series 3D Optical Profiling Microscope combines laser confocal, white light interferometry, and focus variation methods into a single metrology system, enabling highly accurate, non-contact measurements on nearly any material and surface geometry. Its newly-developed multi-point measurement function further streamlines the analysis process by automating measurements across multiple locations and samples—eliminating complex setup or programming while delivering greater usability, throughput, and repeatability. Three Measurement Principles in One System: Unmatched 3D Precision for Any Surface, Any Material, Any Geometry Laser Confocal Measure any material, any shape. White Light Interferometry Multi-Point Scan for Easy & Automated 3D Measurements Accurately capture 3D surface data with sub-nanometer resolution. Focus Variation Measure fine surface detail over a large area. Easily configure position, coordinates, and magnification settings simply by clicking the point to be measured. Target features on a part can be easily selected. All measurement conditions are automatically applied. Automatic Roughness Analysis The Ra values between these two surfaces is the same, but samples clearly look different. With the AI-Analyzer, dozens of surface parameters are compared to instantly determine which ones show the strongest differences. Ra and Rz are two of the most common roughness parameters, but there are numerous other parameters as well.