TEM microscope Spectra 300

for materials researchfor semiconductorshigh-resolution

High resolution TEM and STEM microscope for all materials science and semiconductor applications. For scientists to advance their understanding of complex samples and develop innovative materials, they must have access to robust, precise instrumentation capable of correlating form and function, as well as resolving space, time and frequency. Thermo Fisher Scientific introduces the Thermo Scientific Spectra 300 (S)TEM – the highest resolution, aberration corrected, scanning transmission electron microscope for all materials science applications. Spectra 300 Transmission Electron Microscope advantages All Spectra 300 (S)TEM's are delivered on new platforms designed to offer an unprecedented level of mechanical stability and highest imaging quality though passive and (optional) active vibration isolation. The system is housed in a fully redesigned enclosure with a built-in on-screen display for convenient specimen loading and removal. For the first time, full modularity and upgradeability can be offered between uncorrected and single-corrected configurations with variable heights, allowing maximum flexibility for different room configurations. The Spectra 300 (S)TEM can be optionally equipped with either a high-energy-resolution extreme field emission gun (X-FEG)/Mono or an ultra-high-energy resolution X-FEG/UltiMono. The monochromators of both sources are automatically excited and tuned with single-click operation to achieve the highest energy resolution possible on each configuration by using OptiMono or OptiMono+ respectively (see video below).