UV spectrometer Nexsa G2 XPS

X-rayX-ray photoelectrondata acquisition

The Thermo Scientific Nexsa G2 X-Ray Photoelectron Spectrometer (XPS) System offers fully automated, high-throughput surface analysis, delivering the data to advance research and development or to solve production problems. By integrating XPS with ion scattering spectroscopy (ISS), UV photoelectron spectroscopy (UPS), reflected electron energy loss spectroscopy (REELS), and Raman spectroscopy, it allows you to conduct true correlative analysis. The system now includes options for sample heating and sample biasing capabilities to increase the range of possible experiments. The Nexsa G2 Surface Analysis System unlocks the potential for advances in materials science, microelectronics, nanotechnology development, and many other applications. Nexsa G2 Surface Analysis System features High-performance X-ray source A new, optimized X-ray monochromator design makes it possible to select an analysis area from 10 µm to 400 µm in 5 µm steps, ensuring data is collected from the feature of interest while maximizing the signal. Optimized electron optics The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition. XPS sample viewing Bring sample features into focus with the Nexsa G2 Surface Analysis System's patented optical viewing system and XPS SnapMap, which helps you pinpoint areas of interest quickly. XPS insulator analysis The patented dual beam flood source couples low-energy ion beams with very low energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need, in most cases, for charge referencing.