X-ray photoelectron spectrometer Nexsa G2 XPS

data acquisitionautomated

X-Ray photoelectron spectrometer with automated surface analysis and multi-technique capabilities. X-ray photoelectron spectroscopy The Thermo Scientific Nexsa G2 X-Ray Photoelectron Spectrometer (XPS) System offers fully automated, high-throughput surface analysis, delivering the data to advance research and development or to solve production problems. The integration of XPS with ion scattering spectroscopy (ISS), UV photoelectron spectroscopy (UPS), reflected electron energy loss spectroscopy (REELS), and Raman spectroscopy, allows you to conduct true correlative analysis. The system now includes options for sample heating and sample biasing capabilities to increase the range of experiments now possible. The Nexsa G2 Surface Analysis System unlocks the potential for advances in materials science, microelectronics, nanotechnology development, and many other applications. High-performance X-ray source A new, low-power X-ray monochromator allows selection of the analysis area from 10 µm to 400 µm in 5 µm steps, ensuring data is collected from the feature of interest while maximizing the signal. Optimized electron optics The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition. Sample viewing Bring sample features into focus with the Nexsa XPS System's patented optical viewing system and XPS SnapMap, which helps you pinpoint areas of interest quickly using a fully focused XPS image.