FIB/SEM microscope AMBERfor analysisfor materials researchhigh-precision
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Characteristics
- Type
- FIB/SEM
- Technical applications
- for analysis, for materials research
- Other characteristics
- high-precision, ultra-high resolution
Description
Versatile nanoanalytical FIB-SEM to expand your materials research capabilities
• High precision micro sample preparation
• Ultra-high resolution field-free SEM imaging and nanoanalysis
• Extended field of view and easy navigation
• Multi-site process automation
• Multi-modal FIB-SEM tomography
• Easy-to-use modular software user interface
• Attractive optional packages for various applications
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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.