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Magnification: 160 unit - 200,000 unit
Resolution: 0 µm - 10 µm
... A proven large chamber SEM for rapid materials imaging and analysis The Thermo Scientific Phenom XL G3 Desktop SEM sets the stage for faster and more efficient quality control and failure analysis. Its larger stage ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Magnification: 160 unit - 350,000 unit
Resolution: 8, 6, 5, 20, 10 nm
Weight: 50 kg
... Pro G6 Desktop SEM with integrated EDS for comprehensive X-ray elemental analysis. features Entry-level SEM with high-brightness CeB6 source, suited to educational and basic R&D tasks. User friendly and cost effective. Advanced ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Magnification: 160 unit - 350,000 unit
Resolution: 8, 6 nm
... combining all the features of the Phenom Pro G6 Desktop SEM with integrated EDS for comprehensive X-ray elemental analysis. Features For advanced analytical capabilities, the Phenom ProX G6 Desktop SEM integrates ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Magnification: 3,000,000 unit
Resolution: 0.8, 0.4, 1.2 nm
... elemental analysis in both SEM and STEM mode. Product features: - SEM-STEM combination with ExB-filtered SEM signal and scattering angle-dependent transmission signal detection - Cold field emitter ...
Hitachi High-Tech Europe GmbH
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.9, 0.6 nm
Equipped with a 150mm sample airlock as standard, the SU8700 offers high sample throughput even for larger samples and a constantly clean sample chamber environment for low-contamination, high-resolution imaging. In addition, the sample chamber can be ...
Hitachi High-Tech Europe GmbH
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.9, 0.8 nm
... probing, microtome serial sections, etc.). Equipped like the SU8700 with Hitachi’s universal high-resolution, field-free electron optics (consisting of Schottky emitter and beam booster), the SU7000 also has a large analytical sample ...
Hitachi High-Tech Europe GmbH
... Clear visibility promotes new discovery Nowadays, not only resolution and analytical performance on the nanometer order, but also throughput in data acquisition are considered important. The newly born JSM-IT710HR is the fourth-generation model of ...
Magnification: 40 unit - 300,000 unit
Resolution: 4 nm - 8 nm
Weight: 120 kg
... Benchtop Scanning Electron Microscope CEM3000A is a precision instrument designed for microscale morphology observation and analysis of material surfaces. Equipped with a secondary electron ...
... A unique combination of Plasma FIB and field-free UHR FE-SEM for multiscale materials characterization • High throughput, large area FIB processing up to 1 mm • Ga-free microsample preparation • Ultra-high resolution, field-free FEG-SEM imaging and ...
Magnification: 25 unit - 200,000 unit
Weight: 330 kg
Length: 835 mm
... fully functional atomic force microscope with SEM. It is capable of most normal measurement modes expected from a standard AFM, including contact, dynamic, and FIRE modes. Switch between a sub-nanometer resolution AFM and SEM ...
Magnification: 1 unit - 2,500,000 unit
Resolution: 0.8 nm - 1.3 nm
Weight: 950 kg
... FESEM Microscope SEM5000Pro Specifications • Electron Optics Resolution：0.8 nm @ 15 kV, SE/1.2 nm @ 1.0 kV, SE Acceleration Voltage：0.02kV ~ 30 kV Magnificationn (Polaroid)：1 ~ 2,500,000 x Electron ...
CIQTEK Co., Ltd.
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