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... reduce manual alignment and speed acquisitions.
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Magnification: 160 unit - 200,000 unit
Resolution: 0 µm - 10 µm
... A proven large chamber SEM for rapid materials imaging and analysis The Thermo Scientific Phenom XL G3 Desktop SEM sets the stage for faster and more efficient quality control and failure analysis. Its larger stage ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Magnification: 160 unit - 350,000 unit
Resolution: 8, 5, 6, 10, 20 nm
Weight: 50 kg
... Pro G6 Desktop SEM with integrated EDS for comprehensive X-ray elemental analysis. features Entry-level SEM with high-brightness CeB6 source, suited to educational and basic R&D tasks. User friendly and cost effective. Advanced ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.6, 0.9, 0.8 nm
Weight: 25 kg
Equipped with a 150mm sample airlock as standard, the SU8700 offers high sample throughput even for larger samples and a constantly clean sample chamber environment for low-contamination, high-resolution imaging. In addition, the sample chamber can be ...
Hitachi High-Tech Europe GmbH
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.9, 0.8 nm
Weight: 970 kg
... high-performance
electron optics and analytical features, but come with different chamber and stage sizes.
The SU7000 and SU8700 are built to handle a wide range of applications. Their high brightness Schottky field emission
electron ...
Hitachi High-Tech Europe GmbH
Magnification: 5 unit - 800,000 unit
Resolution: 0.9, 2.5, 1.6, 3, 15 nm
... modular, user-friendly scanning
electron
microscope platform with variable chamber pressure capabilities.What is the SU3800/3900 family?
The Hitachi SU3800/3900 family is a modular, user-friendly scanning
electron ...
Hitachi High-Tech Europe GmbH
... Clear visibility promotes new discovery Nowadays, not only resolution and analytical performance on the nanometer order, but also throughput in data acquisition are considered important. The newly born JSM-IT710HR is the fourth-generation model of ...
Magnification: 40 unit - 300,000 unit
Resolution: 4 nm - 8 nm
Weight: 120 kg
... Benchtop Scanning Electron Microscope CEM3000A is a precision instrument designed for microscale morphology observation and analysis of material surfaces. Equipped with a secondary electron ...
... A unique combination of Plasma FIB and field-free UHR FE-SEM for multiscale materials characterization • High throughput, large area FIB processing up to 1 mm • Ga-free microsample preparation • Ultra-high resolution, field-free FEG-SEM imaging and ...
Magnification: 25 unit - 200,000 unit
Weight: 330 kg
Length: 835 mm
... fully functional atomic force microscope with SEM. It is capable of most normal measurement modes expected from a standard AFM, including contact, dynamic, and FIRE modes. Switch between a sub-nanometer resolution AFM and SEM ...
Magnification: 1 unit - 2,500,000 unit
Resolution: 0.8 nm - 1.3 nm
Weight: 950 kg
... FESEM Microscope SEM5000Pro Specifications • Electron Optics Resolution：0.8 nm @ 15 kV, SE/1.2 nm @ 1.0 kV, SE Acceleration Voltage：0.02kV ~ 30 kV Magnificationn (Polaroid)：1 ~ 2,500,000 x Electron ...
CIQTEK Co., Ltd.
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