Secondary electron microscopes

Magnification: 2,000,000 unit
Resolution: 2, 10, 3 nm

Tabletop field emission gun scanning electron microscope for high quality imaging across disciplines. Field emission gun scanning electron microscope The Thermo Scientific ...

Resolution: 1.4, 0.7, 1.2 nm
Weight: 5 kg

... high-resolution, advanced 3D characterization and analysis at the nanometer scale. Backscattered electron and secondary electron imaging The innovative NICol electron ...

Resolution: 7, 3 nm
Weight: 5 kg

Scanning electron microscope for industrial research and development with environmental scanning electron microscope capability. Environmental scanning electron ...

Magnification: 160 unit - 200,000 unit
Resolution: 0 µm - 10 µm

Phenom XL G2 Desktop SEM applications The next-generation Thermo Scientific Phenom XL G2 Desktop Scanning Electron Microscope (SEM) automates your quality control process, providing ...

Magnification: 160 unit - 350,000 unit
Resolution: 8, 6 nm

Desktop SEM for robust and effortless SEM analysis, expanding your research capability. Phenom Pro Desktop SEM The sixth-generation of Thermo Scientific Phenom Pro G6 Desktop SEM ...

Magnification: 160 unit - 350,000 unit
Resolution: 8, 6 nm

Desktop SEM with EDS capability for robust, effortless, and versatile elemental and SEM analysis. Phenom Desktop SEM with energy-dispersive X-ray diffraction The sixth-generation ...

Magnification: 160 unit - 175,000 unit
Resolution: 0 nm - 15 nm

Desktop SEM that is economical and easy to use, with reliable automation features. The Thermo Scientific Phenom Pure Desktop Scanning Electron Microscope (SEM) is an ideal tool for ...

Magnification: 160 unit - 200,000 unit
Resolution: 0 nm - 10 nm

Desktop scanning electron microscope for battery production and research. Advanced battery materials analysis Phenom Desktop SEM designed for battery materials analysis In battery ...

Magnification: 160 unit - 200,000 unit
Resolution: 0 nm - 10 nm

... ISO 4406/4407 are available. Secondary electron detector A secondary electron detector (SED) is optionally available on the Phenom ParticleX TC (Technical Cleanliness) ...

Magnification: 160 unit - 200,000 unit
Resolution: 10 nm

Desktop SEM for additive manufacturing analysis, capable of observing large samples up to 100 mm x 100 mm. Additive manufacturing analysis The Thermo Scientific Phenom ParticleX Desktop Scanning Electron ...

Magnification: 3,000,000 unit
Resolution: 0.8, 0.4, 1.2 nm

... SU9000 utilizes an ultra-stable side-entry sample stage similar to high-end TEM systems and incorporates optimized vibration damping and a closed cabinet to shield the electron optics from environmental noise.

Magnification: 20 unit - 2,000,000 unit
Resolution: 0.9, 0.8 nm

The SU8700 brings in a new era of ultrahigh-resolution Schottky field emission scanning electron microscopes to the long-standing Hitachi EM lineup. This revolutionary FE-SEM platform incorporates multifaceted ...

Magnification: 20 unit - 2,000,000 unit
Resolution: 0.9, 0.8 nm

... newly designed electron optics and detection systems allows for efficient simultaneous acquisition of multiple secondary electron and back-scattered electron signals. Multi-Channel ...

Resolution: 1.2 nm

... -based system for SEM imaging that goes beyond basic preset conditions and recipes. Its ease of use opens a new gateway for material research, development, and area beyond our imagination. The SU5000 FE-SEM has forever ...

Magnification: 5 unit - 800,000 unit
Resolution: 15, 4, 3 nm

Performance & Power in a Flexible Platform Hitachi High-Tech's scanning electron microscopes SU3800/SU3900 deliver both operability and expandability. The operator can automate many operations and efficiently ...

Magnification: 6 unit - 800,000 unit
Resolution: 4, 5, 15 nm

... available in a full-sized SEM. This SEM runs on clean energy for an economical analytical tool, without compromising performance. The FlexSEM 1000 II Scanning Electron Microscope ...

Magnification: 10 unit - 25,000,054 unit
Weight: 54 kg
Length: 614, 617 mm

... innovation and cutting-edge technologies which redefine the capabilities of a tabletop microscope. This new generation of the long-standing Hitachi tabletop microscopes (TM) integrates ease of use, optimized ...

Magnification: 20 unit - 8,000,000 unit
Resolution: 0.08, 0.1 nm

... corrector • High-brightness and high-stability cold FE electron gun (Cold FEG) • Ultra-stable column and power supplies for enhanced instrument performance • Simultaneous Cs-corrected SEM & STEM ...

Magnification: 25 unit - 200,000 unit
Weight: 330 kg
Length: 835 mm

... fully functional atomic force microscope with SEM. It is capable of most normal measurement modes expected from a standard AFM, including contact, dynamic, and FIRE modes. Switch between a sub-nanometer resolution AFM ...

Magnification: 1 unit - 2,500,000 unit
Resolution: 1, 1.5, 0.8 nm
Weight: 950 kg

CIQTEK SEM5000 is a high-resolution, feature-rich field emission scanning electron microscope (FE-SEM, FEG SEM). Advanced column design, high voltage tunneling technology (SuperTunnel), low aberration ...

Resolution: 0.9, 2.5 nm

CIQTEK SEM4000Pro is an analytical field emission scanning electron microscope equipped with a high-brightness long-life Schottky field emission electron gun. With the three-stage ...

Magnification: 1 unit - 2,500,000 unit
Resolution: 0.6 nm
Weight: 400 kg

SEM5000X is an ultra-high resolution Field Emission Scanning Electron Microscope(FE-SEM) with breakthrough resolution of 0.6 nm@15 kV and 1.0 nm@1 kV. Benefited from upgraded column engineering process, ...

Resolution: 3, 1.2 nm

CIQTEK DB500 is a Field Emission Scanning Electron Microscope with a Focused Ion Beam column for nano analysis and specimen preparation, which is applied with “SuperTunnel” technology, low aberration, ...

CIQTEK Quantum NV scanning microscope is based on diamond nitrogen-vacancy center (NV center) and AFM scanning magnetic imaging technology. The magnetic properties of the sample are obtained quantitatively and non-destructively ...