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Resolution: 0.7, 1, 0.6 nm
... of nanomaterials with sub-nanometer resolution and high material contrast. Verios 5 XHR Scanning Electron Microscope The Verios 5 XHR SEM offers subnanometer resolution over the full 1 keV to 30 keV energy range ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Magnification: 6 unit - 2,500,000 unit
Resolution: 1, 1.3, 3, 0.8 nm
Width: 340 mm
... versatility. The Thermo Scientific Quattro ESEM can help you analyze the widest range of samples of any Thermo Scientific SEM and includes three vacuum modes that support outgassing and non-vacuum compatible samples. It delivers high-resolution ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Resolution: 0.9, 0.8, 1, 1.2 nm
Weight: 5 kg
Width: 340 mm
... experience. Time on the microscope is precious, and excessive time spent on maintenance, alignments, training, or image optimization needs to be avoided. Apreo 2 Scanning Electron Microscope The new Thermo Scientific ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Resolution: 0.7 nm - 1.8 nm
Weight: 5 kg
Width: 340 mm
... overview Enhanced SEM imaging features Elevate your imaging results to new heights with innovative features like Smart Frame Integration (SFI) and automated alignment functionalities. Complete material analysis Dedicated EDS ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Resolution: 1,030, 515 nm
... polishing. In most cases, the laser-milled surfaces are clean enough for direct SEM imaging and even for surface-sensitive techniques such as electron backscatter diffraction ( EBSD) mapping. We offer a broad product ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Resolution: 0.7, 1.2, 1.4 nm
Weight: 5 kg
... The Thermo Scientific Scios 3 FIB-SEM is an advanced, ultra-high-resolution analytical-focused ion beam scanning electron microscope (FIB-SEM). It excels in delivering exceptional sample preparation and 3D characterization for a wide range ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Magnification: 20 unit - 1,000,000 unit
Resolution: 4, 1.6, 1.2 nm
... high-resolution SEM observations and fast analyses can be conducted utilizing energy dispersive X-ray spectroscopy (EDS) and electron backscatter diffraction ( EBSD). Additionally, a three-dimensional analysis function ...
Jeol
... to ensure high quality data and an enhanced user experience for all SEM users. Functions include the SEM automatic adjustment package, a trapezoidal correction function (useful for EBSD measurements) ...
Jeol
Magnification: 10 unit - 5,480,000 unit
Resolution: 0.7 nm - 3 nm
... dispersive X-ray spectrometer (EDS), as a common platform. The JSM-IT800 allows for the replacement of the objective lens of the SEM as a module, offering different versions to satisfy various users requirements. With the JSM-IT800, ...
Jeol
Magnification: 300,000 unit
Resolution: 4, 7, 3 nm
Weight: 480 kg
... Brightness & Contrast, Auto Focus, Automatic Stigmator The CIQTEK SEM3200 SEM Microscope is an excellent general-purpose Tungsten Filament Scanning Electron Microscope (SEM) with outstanding overall ...
CIQTEK Co., Ltd.
Magnification: 1 unit - 2,500,000 unit
Resolution: 0.8 nm - 1.3 nm
Weight: 950 kg
... Retractable Scanning Transmission Electron Microscope(STEM) Low Vacuum Detector（LVD） Energy Dispersive Spectroscopy (EDS / EDX) Electron Backscatter Diffraction Pattern ( EBSD) ...
CIQTEK Co., Ltd.
Magnification: 1,000,000 unit
Resolution: 0.9 nm - 2.5 nm
... CIQTEK SEM4000Pro FESEM Microscope Specifications • Electron Optics - Resolution: High Vacuum 0.9 nm @ 30 kV, SE Low Vacuum 2.5 nm @ 30 kV, BSE, 30 Pa/1.5 nm @ 30 kV, SE, 30 Pa Acceleration Voltage: 0.2 kV ~ ...
CIQTEK Co., Ltd.
Magnification: 300,000 unit
Resolution: 4.5, 3.9 nm
... CIQTEK SEM2100 SEM Microscope Specifications Electron Optics Resolution: 3.9 nm @ 20 kV, SE 4.5 nm @ 20 kV, BSE Accelerating Voltage: 0.5 kV ~ 30 kV Magnification (Polaroid): 1 x ~ 300,000 x Specimen ...
CIQTEK Co., Ltd.
Magnification: 1 unit - 2,500,000 unit
Resolution: 0.6 nm - 1 nm
Weight: 400 kg
... CIQTEK SEM5000X FESEM Microscope Specifications Electron Optics Resolution: 0.6 nm @ 15 kV, SE 1.0 nm @ 1 kV, SE Acceleration Voltage: 0.02kV ~30 kV Magnification: 1 ~ 2,500,000 x Electron Gun Type: Schottky ...
CIQTEK Co., Ltd.
Resolution: 3, 0.9, 1.6 nm
... (STEM) Energy Dispersive Spectrometer (EDS/EDX) Electron Backscatter Diffraction Pattern ( EBSD) Nano-manipulator Gas Injection System Plasma Cleaner ...
CIQTEK Co., Ltd.
Magnification: 1,000,000 unit
Resolution: 0.9, 1.2, 1.9 nm
... CIQTEK SEM4000X FESEM Microscope Specifications Electron Optics - Resolution: 0.9 nm@ 30 kV, SE 1.2 nm@15 kV, SE 1.9 nm@1 kV, SE 1.5 nm@1 kV (Ultra beam deceleration) ...
CIQTEK Co., Ltd.
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