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Back-scattered electron microscopes
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... Manufacturer / brand: Thermo Scientific
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Magnification: 160 unit - 200,000 unit
Resolution: 0 µm - 10 µm
... A proven large chamber SEM for rapid materials imaging and analysis The Thermo Scientific Phenom XL G3 Desktop SEM sets the stage for faster and more efficient quality control and failure analysis. Its larger stage ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Magnification: 160 unit - 350,000 unit
Resolution: 8, 5, 6, 10, 20 nm
Weight: 50 kg
... Pro G6 Desktop SEM with integrated EDS for comprehensive X-ray elemental analysis. features Entry-level SEM with high-brightness CeB6 source, suited to educational and basic R&D tasks. User friendly and cost effective. Advanced ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Magnification: 160 unit - 350,000 unit
Resolution: 8, 6 nm
... combining all the features of the Phenom Pro G6 Desktop SEM with integrated EDS for comprehensive X-ray elemental analysis. Features For advanced analytical capabilities, the Phenom ProX G6 Desktop SEM integrates ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Magnification: 160 unit - 175,000 unit
Resolution: 0 nm - 15 nm
Weight: 50 kg
... advanced model, combining all the features of the Phenom Pro G6 Desktop SEM with integrated EDS for comprehensive X-ray elemental analysis. Features Desktop SEM with a durable electron source and ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Magnification: 160 unit - 200,000 unit
Resolution: 0 nm - 10 nm
Weight: 75 kg
... Thermo Scientific Phenom ParticleX Battery Desktop SEM offers outstanding speed and precision. It delivers lightning-fast throughput that’s up to 10 times faster than traditional scanning electron microscopes, ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Magnification: 160 unit - 200,000 unit
Resolution: 0 nm - 10 nm
Weight: 75 kg
... especially in demanding manufacturing environments like automotive. Compared to traditional optical microscopes, our Thermo Scientific Phenom ParticleX TC Desktop SEM not only enables you to conduct more detailed compositional ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Magnification: 2,000,000 unit
Resolution: 10, 3, 2, 200, 400 nm
Weight: 75 kg
... deliver these benefits in part because of its electron source. It uses a field emission gun, in which a small electro-magnetic field extracts electrons from the source. This gives you better control of the microscope ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Resolution: 7, 3, 8, 20 nm
Weight: 10 kg
The Thermo Scientific Axia ChemiSEM System was designed to take the complexity out of microscopy and help you elevate your quantitative elemental analysis. Featuring a tungsten source and fully integrated energy-dispersive X-ray spectroscopy (EDS) capabilities, ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
field emission scanning electron microscopeSU8700
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.6, 0.9, 0.8 nm
Weight: 25 kg
Equipped with a 150mm sample airlock as standard, the SU8700 offers high sample throughput even for larger samples and a constantly clean sample chamber environment for low-contamination, high-resolution imaging. In addition, the sample chamber can be ...
Hitachi High-Tech Europe GmbH
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.7, 0.6 nm
Weight: 25 kg
... specimen loading through standard six inch exchange chamber.
Overview
The SU8600 is a dedicated imaging
SEM offering ultra-high resolution thanks to Hitachi’s cold field emission (CFE) technology. Designed to meet ...
Hitachi High-Tech Europe GmbH
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.9, 0.8 nm
Weight: 970 kg
... high-performance
electron optics and analytical features, but come with different chamber and stage sizes.
The SU7000 and SU8700 are built to handle a wide range of applications. Their high brightness Schottky field emission
electron ...
Hitachi High-Tech Europe GmbH
Magnification: 5 unit - 800,000 unit
Resolution: 0.9, 2.5, 1.6, 3, 15 nm
... modular, user-friendly scanning
electron
microscope platform with variable chamber pressure capabilities.What is the SU3800/3900 family?
The Hitachi SU3800/3900 family is a modular, user-friendly scanning
electron ...
Hitachi High-Tech Europe GmbH
Magnification: 10 unit - 250,000 unit
Weight: 55, 53 kg
Length: 614, 617 mm
... Hitachi TM4000PlusIII scanning electron microscope offers a compact, user-friendly solution for imaging and elemental analysis. Designed for a range of users - from research labs to industrial quality control - this new ...
Hitachi High-Tech Europe GmbH
Magnification: 6 unit - 800,000 unit
Resolution: 15, 4 nm
Weight: 107 kg
... FlexSEM II
The FlexSEM II VP-SEM is designed for researchers and lab managers who need the capabilities of a traditional
SEM in a more compact and easier-to-operate, tabletop-like package.
With high-resolution imaging and ...
Hitachi High-Tech Europe GmbH
Magnification: 40 unit - 300,000 unit
Resolution: 4 nm - 8 nm
Weight: 120 kg
... Benchtop Scanning Electron Microscope CEM3000A is a precision instrument designed for microscale morphology observation and analysis of material surfaces. Equipped with a secondary electron probe and ...
Magnification: 1 unit - 2,500,000 unit
Resolution: 0.8 nm - 1.3 nm
Weight: 950 kg
... FESEM Microscope SEM5000Pro Specifications • Electron Optics Resolution:0.8 nm @ 15 kV, SE/1.2 nm @ 1.0 kV, SE Acceleration Voltage:0.02kV ~ 30 kV Magnificationn (Polaroid):1 ~ 2,500,000 x Electron ...
CIQTEK Co., Ltd.
Magnification: 1,000,000 unit
Resolution: 0.9 nm - 2.5 nm
... x Electron Gun Type: Schottky Field Emission Electron Gun • Specimen Chamber Low Vacuum: Max 180 Pa Camera: Dual Cameras (Optical navigation + chamber monitoring) XY Range:110 mm Z Range:65 mm T Range:-10° ...
CIQTEK Co., Ltd.
Magnification: 300,000 unit
Resolution: 4.5, 3.9 nm
... 125 mm Z Range: 50 mm SEM Detectors Standard: Everhart-Thornley Detector (ETD) Optional: Retractable Back- Scattered Electron Detector (BSED) Energy Dispersive Spectrometer ...
CIQTEK Co., Ltd.
Magnification: 1 unit - 2,500,000 unit
Resolution: 0.6 nm - 1 nm
Weight: 400 kg
... : 360° SEM Detectors and Extensions Standard: In-lens Detector Everhart-Thornley Detector (ETD) Optional: - Retractable Back- Scattered Electron Detector (BSED) ...
CIQTEK Co., Ltd.
Resolution: 3, 0.9, 1.6 nm
... Extensions - Standard: - In-lens Electron Detector Everhart-Thornley Detector (ETD) Optional: - Retractable Back- Scattered Electron Detector (BSED) ...
CIQTEK Co., Ltd.
Magnification: 1 unit - 300,000 unit
Resolution: 2.5 nm - 5 nm
Length: 926 mm
... Standard: In-lens Electron Detector (Inlens) Everhart-Thornley Detector (ETD) Optional: Retractable Back- Scattered Electron Detector (BSED) Energy Dispersive ...
CIQTEK Co., Ltd.
Magnification: 66 unit - 1,000,000 unit
Resolution: 1.3 nm
Length: 1,716 mm
... High-speed scanning electron microscope for cross-scale imaging of large-volume specimens CIQTEK HEM6000 facilities technologies such as the high-brightness large-beam current electron gun, high-speed ...
CIQTEK Co., Ltd.
Magnification: 1,000,000 unit
Resolution: 0.9, 1.2, 1.9 nm
... 360° SEM Detectors and Extensions - Standard: In-lens Electron Detector: UD-BSE/UD-SE Everhart-Thornley Detector: LD Optional: Backscattered Electron Detector (BSED) ...
CIQTEK Co., Ltd.
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