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... Manufacturer / brand: Thermo Scientific
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Magnification: 160 unit - 200,000 unit
Resolution: 0 µm - 10 µm
... A proven large chamber SEM for rapid materials imaging and analysis The Thermo Scientific Phenom XL G3 Desktop SEM sets the stage for faster and more efficient quality control and failure analysis. Its larger stage ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Magnification: 160 unit - 350,000 unit
Resolution: 8, 5, 6, 10, 20 nm
Weight: 50 kg
... Pro G6 Desktop SEM with integrated EDS for comprehensive X-ray elemental analysis. features Entry-level SEM with high-brightness CeB6 source, suited to educational and basic R&D tasks. User friendly and cost effective. Advanced ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Magnification: 160 unit - 350,000 unit
Resolution: 8, 6 nm
... combining all the features of the Phenom Pro G6 Desktop SEM with integrated EDS for comprehensive X-ray elemental analysis. Features For advanced analytical capabilities, the Phenom ProX G6 Desktop SEM integrates ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Magnification: 160 unit - 175,000 unit
Resolution: 0 nm - 15 nm
Weight: 50 kg
... advanced model, combining all the features of the Phenom Pro G6 Desktop SEM with integrated EDS for comprehensive X-ray elemental analysis. Features Desktop SEM with a durable electron source and ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Magnification: 160 unit - 200,000 unit
Resolution: 0 nm - 10 nm
Weight: 75 kg
... Thermo Scientific Phenom ParticleX Battery Desktop SEM offers outstanding speed and precision. It delivers lightning-fast throughput that’s up to 10 times faster than traditional scanning electron microscopes, ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Magnification: 160 unit - 200,000 unit
Resolution: 0 nm - 10 nm
Weight: 75 kg
... especially in demanding manufacturing environments like automotive. Compared to traditional optical microscopes, our Thermo Scientific Phenom ParticleX TC Desktop SEM not only enables you to conduct more detailed compositional ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Magnification: 2,000,000 unit
Resolution: 10, 3, 2, 200, 400 nm
Weight: 75 kg
... deliver these benefits in part because of its electron source. It uses a field emission gun, in which a small electro-magnetic field extracts electrons from the source. This gives you better control of the microscope ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Resolution: 7, 3, 8, 20 nm
Weight: 10 kg
The Thermo Scientific Axia ChemiSEM System was designed to take the complexity out of microscopy and help you elevate your quantitative elemental analysis. Featuring a tungsten source and fully integrated energy-dispersive X-ray spectroscopy (EDS) capabilities, ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Magnification: 3,000,000 unit
Resolution: 0.8, 0.4, 1.2 nm
... elemental analysis in both SEM and STEM mode. Product features: - SEM-STEM combination with ExB-filtered SEM signal and scattering angle-dependent transmission signal detection - Cold field emitter ...
Hitachi High-Tech Europe GmbH
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.9, 0.6 nm
Equipped with a 150mm sample airlock as standard, the SU8700 offers high sample throughput even for larger samples and a constantly clean sample chamber environment for low-contamination, high-resolution imaging. In addition, the sample chamber can be ...
Hitachi High-Tech Europe GmbH
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.7, 0.6 nm
... The SU8600 is the successor to the proven Regulus field emission SEM family and fulfills the highest requirements for imaging-oriented applications. The cold field emitter with its near monochromatic emission, combined with a magnetic ...
Hitachi High-Tech Europe GmbH
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.9, 0.8 nm
... probing, microtome serial sections, etc.). Equipped like the SU8700 with Hitachi’s universal high-resolution, field-free electron optics (consisting of Schottky emitter and beam booster), the SU7000 also has a large analytical sample ...
Hitachi High-Tech Europe GmbH
Magnification: 5 unit - 800,000 unit
Resolution: 15, 4, 3 nm
... platform. Product features: - Highly efficient Hitachi detectors: -- Secondary electron detector for high vacuum -- 5-segment semiconductor backscattered electron detector for high and low vacuum, selection ...
Hitachi High-Tech Europe GmbH
Magnification: 6 unit - 800,000 unit
Resolution: 4, 15 nm
... High-resolution electron optics with beam energies between 300eV and 20keV - High and adjustable low vacuum up to 100Pa - SE and 4+1 segment backscatter detector standard, low vacuum SE optional (UVD); can also be used for cathodoluminescence ...
Hitachi High-Tech Europe GmbH
Magnification: 10 unit - 250,000 unit
... Designed as a logical extension of optical stereo microscopy, the TM4000 III is an entry-level device for scanning electron microscopy. It allows you to image samples in the shortest possible time with good resolution, depth of field, ...
Hitachi High-Tech Europe GmbH
Magnification: 40 unit - 300,000 unit
Resolution: 4 nm - 8 nm
Weight: 120 kg
... Benchtop Scanning Electron Microscope CEM3000A is a precision instrument designed for microscale morphology observation and analysis of material surfaces. Equipped with a secondary electron probe and ...
Magnification: 1 unit - 2,500,000 unit
Resolution: 0.8 nm - 1.3 nm
Weight: 950 kg
... FESEM Microscope SEM5000Pro Specifications • Electron Optics Resolution：0.8 nm @ 15 kV, SE/1.2 nm @ 1.0 kV, SE Acceleration Voltage：0.02kV ~ 30 kV Magnificationn (Polaroid)：1 ~ 2,500,000 x Electron ...
CIQTEK Co., Ltd.
Magnification: 1,000,000 unit
Resolution: 0.9 nm - 2.5 nm
... x Electron Gun Type: Schottky Field Emission Electron Gun • Specimen Chamber Low Vacuum: Max 180 Pa Camera: Dual Cameras (Optical navigation + chamber monitoring) XY Range:110 mm Z Range:65 mm T Range:-10° ...
CIQTEK Co., Ltd.
Magnification: 300,000 unit
Resolution: 4.5, 3.9 nm
... 125 mm Z Range: 50 mm SEM Detectors Standard: Everhart-Thornley Detector (ETD) Optional: Retractable Back- Scattered Electron Detector (BSED) Energy Dispersive Spectrometer ...
CIQTEK Co., Ltd.
Magnification: 1 unit - 2,500,000 unit
Resolution: 0.6 nm - 1 nm
Weight: 400 kg
... : 360° SEM Detectors and Extensions Standard: In-lens Detector Everhart-Thornley Detector (ETD) Optional： - Retractable Back- Scattered Electron Detector (BSED) ...
CIQTEK Co., Ltd.
Resolution: 3, 0.9, 1.6 nm
... Extensions - Standard: - In-lens Electron Detector Everhart-Thornley Detector (ETD) Optional: - Retractable Back- Scattered Electron Detector (BSED) ...
CIQTEK Co., Ltd.
Magnification: 1 unit - 300,000 unit
Resolution: 2.5 nm - 5 nm
Length: 926 mm
... Standard: In-lens Electron Detector (Inlens) Everhart-Thornley Detector (ETD) Optional: Retractable Back- Scattered Electron Detector (BSED) Energy Dispersive ...
CIQTEK Co., Ltd.
Magnification: 66 unit - 1,000,000 unit
Resolution: 1.3 nm
Length: 1,716 mm
... High-speed scanning electron microscope for cross-scale imaging of large-volume specimens CIQTEK HEM6000 facilities technologies such as the high-brightness large-beam current electron gun, high-speed ...
CIQTEK Co., Ltd.
Magnification: 1,000,000 unit
Resolution: 0.9, 1.2, 1.9 nm
... 360° SEM Detectors and Extensions - Standard: In-lens Electron Detector: UD-BSE/UD-SE Everhart-Thornley Detector: LD Optional: Backscattered Electron Detector (BSED) ...
CIQTEK Co., Ltd.
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