Hitachi back-scattered electron microscopes

1 company | 7 products
{{#pushedProductsPlacement4.length}} {{#each pushedProductsPlacement4}}
{{product.productLabel}}

{{product.productLabel}} {{product.model}}

{{#if product.featureValues}}
{{#each product.featureValues}} {{content}} {{/each}}
{{/if}}
{{#if product.productPrice }} {{#if product.productPrice.price }}

{{product.productPrice.formattedPrice}} {{#if product.productPrice.priceType === "PRICE_RANGE" }} - {{product.productPrice.formattedPriceMax}} {{/if}}
{{/if}} {{/if}}
{{#if product.activeRequestButton}}
{{/if}}
{{product.productLabel}}
{{product.model}}

{{#each product.specData:i}} {{name}}: {{value}} {{#i!=(product.specData.length-1)}}
{{/end}} {{/each}}

{{{product.idpText}}}

{{productPushLabel}}
{{#if product.newProduct}}
{{/if}} {{#if product.hasVideo}}
{{/if}} {{#each product.productTagAssociationList}}
{{/each}}
{{/each}} {{/pushedProductsPlacement4.length}}
{{#pushedProductsPlacement5.length}} {{#each pushedProductsPlacement5}}
{{product.productLabel}}

{{product.productLabel}} {{product.model}}

{{#if product.featureValues}}
{{#each product.featureValues}} {{content}} {{/each}}
{{/if}}
{{#if product.productPrice }} {{#if product.productPrice.price }}

{{product.productPrice.formattedPrice}} {{#if product.productPrice.priceType === "PRICE_RANGE" }} - {{product.productPrice.formattedPriceMax}} {{/if}}
{{/if}} {{/if}}
{{#if product.activeRequestButton}}
{{/if}}
{{product.productLabel}}
{{product.model}}

{{#each product.specData:i}} {{name}}: {{value}} {{#i!=(product.specData.length-1)}}
{{/end}} {{/each}}

{{{product.idpText}}}

{{productPushLabel}}
{{#if product.newProduct}}
{{/if}} {{#if product.hasVideo}}
{{/if}} {{#each product.productTagAssociationList}}
{{/each}}
{{/each}} {{/pushedProductsPlacement5.length}}
scanning transmission electron microscope
scanning transmission electron microscope
SU9000 II

Magnification: 3,000,000 unit
Resolution: 0.8, 0.4, 1.2 nm

... elemental analysis in both SEM and STEM mode. Product features: - SEM-STEM combination with ExB-filtered SEM signal and scattering angle-dependent transmission signal detection - Cold field emitter ...

See the other products
Hitachi High-Tech Europe GmbH
field emission scanning electron microscope
field emission scanning electron microscope
SU8700

Magnification: 20 unit - 2,000,000 unit
Resolution: 0.9, 0.6 nm

Equipped with a 150mm sample airlock as standard, the SU8700 offers high sample throughput even for larger samples and a constantly clean sample chamber environment for low-contamination, high-resolution imaging. In addition, the sample chamber can be ...

See the other products
Hitachi High-Tech Europe GmbH
field emission scanning electron microscope
field emission scanning electron microscope
SU8600

Magnification: 20 unit - 2,000,000 unit
Resolution: 0.7, 0.6 nm

... The SU8600 is the successor to the proven Regulus field emission SEM family and fulfills the highest requirements for imaging-oriented applications. The cold field emitter with its near monochromatic emission, combined with a magnetic ...

See the other products
Hitachi High-Tech Europe GmbH
field emission scanning electron microscope
field emission scanning electron microscope
SU7000

Magnification: 20 unit - 2,000,000 unit
Resolution: 0.9, 0.8 nm

... probing, microtome serial sections, etc.). Equipped like the SU8700 with Hitachi’s universal high-resolution, field-free electron optics (consisting of Schottky emitter and beam booster), the SU7000 also has a large analytical sample ...

See the other products
Hitachi High-Tech Europe GmbH
scanning electron microscope
scanning electron microscope
SU3800/3900 Family

Magnification: 5 unit - 800,000 unit
Resolution: 15, 4, 3 nm

... platform. Product features: - Highly efficient Hitachi detectors: -- Secondary electron detector for high vacuum -- 5-segment semiconductor backscattered electron detector for high and low ...

See the other products
Hitachi High-Tech Europe GmbH
scanning electron microscope
scanning electron microscope
FlexSEM II

Magnification: 6 unit - 800,000 unit
Resolution: 4, 15 nm

... High-resolution electron optics with beam energies between 300eV and 20keV - High and adjustable low vacuum up to 100Pa - SE and 4+1 segment backscatter detector standard, low vacuum SE optional (UVD); can also be used for cathodoluminescence ...

See the other products
Hitachi High-Tech Europe GmbH
SEM microscope
SEM microscope
TM4000PlusIII

Magnification: 10 unit - 250,000 unit

... 20kV with 5 probe current modes each - Optical colour navigation camera - 3 chamber pressure stages - 4-segment backscattered electron detector - Probe current reading and IFT functionality ...

See the other products
Hitachi High-Tech Europe GmbH
exhibit your products

& reach your clients in one place, all year round

Exhibit with us